A Digital Cds Scheme On Fully Columninline Tdc Architecture For An Apsc Format Cmos Image Sensor

• doi:
• title: A digital CDS scheme on fully column-inline TDC architecture for an APS-C format CMOS image sensor
• publisher: IEEE
• isbn: 978-4-86348-166-4
• issn: 2158-5601
• partnum: 11CH38825
• rank: 1040
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper proposes a digital correlate double sampling (CDS) scheme which is suitable for a column-inline time to digital converter (TDC). The column-parallel TDCs, where measurements are made with a counter and delay line interpolation, achieve high speed A/D conversion without decreasing resolution. An APS-C format image sensor with 12-bit 360 Mpixel/s readout is realized in a cost-effective 0.18-μm CMOS technology.
• article_number: 5986399
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5986399
• html_url: https://ieeexplore.ieee.org/document/5986399/
• abstract_url: https://ieeexplore.ieee.org/document/5986399/
• publication_title: 2011 Symposium on VLSI Circuits - Digest of Technical Papers
• conference_location: Kyoto, Japan
• conference_dates: 15-17 June 2011
• publication_number: 5976946
• is_number: 5985982
• publication_year: 2011
• publication_date: 15-17 June 2011
• start_page: 90
• end_page: 91
• citing_paper_count: 1
• citing_patent_count: 1
• download_count: 1627
• insert_date: 20110818
• index_terms:
  • ieee_terms:
    • Radiation detectors
    • Decoding
    • CMOS image sensors
    • Clocks
    • Noise
    • Timing
    • CMOS integrated circuits
  • author_terms:
    • TDC
    • CMOS image sensor
    • column-parallel architecture
    • correlate double sampling (CDS)
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Time-to-digital Converter
    • Decoding
    • Decryption
    • Sampling Period
    • Number Of Values
    • Low Noise
    • Binary Code
    • Conversion Time
    • Clock Frequency
    • Large Sensor
    • 12-bit Resolution
• isbn_formats:
  • format: CD, value: 978-4-86348-166-4, isbnType: New-2005
  • format: Print ISBN, value: 978-1-61284-175-5, isbnType: New-2005
• authors:
  • Author Name: Tomohiro Takahashi
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37961403900
    ID: 37961403900
    Order: 1
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan
  • Author Name: Hiroki Ui
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682884
    ID: 37088682884
    Order: 2
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan
  • Author Name: Nozomu Takatori
    Affiliation: Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682910
    ID: 37088682910
    Order: 3
    Author Affiliations:
    • Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
  • Author Name: Shingo Sanada
    Affiliation: Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682570
    ID: 37088682570
    Order: 4
    Author Affiliations:
    • Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
  • Author Name: Takeshige Hamamoto
    Affiliation: Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682763
    ID: 37088682763
    Order: 5
    Author Affiliations:
    • Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
  • Author Name: Hideo Nakayama
    Affiliation: Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682587
    ID: 37088682587
    Order: 6
    Author Affiliations:
    • Sony LSI Design Incorporated, Isahaya, Nagasaki, Japan
  • Author Name: Yusuke Moriyama
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37951895000
    ID: 37951895000
    Order: 7
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan
  • Author Name: Miho Akahide
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088682581
    ID: 37088682581
    Order: 8
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan
  • Author Name: Takahisa Ueno
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37449727500
    ID: 37449727500
    Order: 9
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan
  • Author Name: Noriyuki Fukushima
    Affiliation: Sony Corporation, Atsugi, Kanagawa, Japan
    Author URL: https://ieeexplore.ieee.org/author/37969154400
    ID: 37969154400
    Order: 10
    Author Affiliations:
    • Sony Corporation, Atsugi, Kanagawa, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 12-bit 360 Mpixel/s
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• noise: 2.23 e-rms total random noise; 0.20 e-rms vertical fixed pattern noise

Applications & Benefits

• cell_imaging: not specified
• benefits: High-speed readout without hurting resolution and low noise characteristics.

Supporting Organizations

• supported_by: Sony Corporation; Sony LSI Design Incorporated

Manuscript Details

• publication_date: 15-17 June 2011

Relevancy Score

• score: 10
• missing_fields:
  • pixel_size
  • dynamic_range
  • sensitivity
  • shutter_speed
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate

Processed JSON Filename

request_0143a879-30d7-47ba-817f-b341dc89a70a-a_digital_cds_scheme_on_fully_columninline_tdc_architecture_for_an_apsc_format_cmos_image_sensor.json