A Deep Subelectron Temporal Noise Cmos Image Sensor With Adjustable
Sinctype Filter To Achieve Photoncounting Capability
- doi: 10.1109/LSSC.2021.3089364
-
title: A Deep Subelectron Temporal Noise CMOS Image
Sensor With Adjustable Sinc-Type Filter to Achieve Photon-Counting
Capability
- publisher: IEEE
- isbn:
- issn: 2573-9603
- rank: 687
- access_type: LOCKED
- content_type: Journals
-
abstract: This letter introduces a Gm-cell-based CMOS
image sensor (CIS) achieving deep subelectron noise performance. The CIS
presents a new compensation block and low-noise current source to
improve the performance of the Gm pixel. Furthermore, an optional
first-order IIR filter is implemented to improve the output swing. The
conversion gain, full well capacity, and dynamic range of the CIS can be
easily adjusted by the charging time and the filter mode for different
applications. The prototype chip is fabricated in a standard 180 nm CIS
process and has a deep subelectron read noise of 0.31e-rms at minimum
(of the noise distribution) and 0.42e-rms at peak (of the noise
distribution). A smooth and clear photon-counting histogram is observed.
- article_number: 9454499
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9454499
-
html_url:
https://ieeexplore.ieee.org/document/9454499/
-
abstract_url:
https://ieeexplore.ieee.org/document/9454499/
-
publication_title: IEEE Solid-State Circuits Letters
- conference_location:
- conference_dates:
- publication_number: 8011414
- is_number: 9329187
- publication_year: 2021
- publication_date: 2021
- start_page: 113
- end_page: 116
- citing_paper_count: 5
- citing_patent_count: 0
- download_count: 762
- insert_date: 20210614
-
index_terms:
-
ieee_terms:
- Finite impulse response filters
- IIR filters
- Photonics
- Fluctuations
- Transfer functions
- Histograms
- Temperature distribution
-
author_terms:
- CMOS image sensor (CIS)
- noise distribution
- photon counting
- sinc-type filter
- ultralow noise
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Temporal Noise
- Dynamic Range
- Current Source
- Current Regulations
- Peak Distribution
- Charging Time
- Noise Performance
- First-order Filter
- Conversion Gain
- Mode Filter
- IIR Filter
- Temperature Coefficient
- Extraction Accuracy
- Noise Values
- Log-log Scale
- Minimum Noise
- Pixel Array
- Dc Value
- Noisy Pixels
- Charging Phase
-
authors:
-
Author Name: Liqiang Han
Affiliation: Electronic Instrumentation Laboratory,
Delft University of Technology, Delft, The Netherlands
Author URL:
https://ieeexplore.ieee.org/author/37085733626
ID: 37085733626
Order: 1
Author Affiliations:
-
Electronic Instrumentation Laboratory, Delft University of
Technology, Delft, The Netherlands
-
Detector Lab, Beijing Institute of Space Mechanics and
Electricity, Beijing, China
-
Author Name: Albert J. P. Theuwissen
Affiliation: Electronic Instrumentation Laboratory,
Delft University of Technology, Delft, The Netherlands
Author URL:
https://ieeexplore.ieee.org/author/37282956500
ID: 37282956500
Order: 2
Author Affiliations:
-
Electronic Instrumentation Laboratory, Delft University of
Technology, Delft, The Netherlands
- Harvest Imaging, Bree, Belgium
Image Sensor
- sensor_type: CMOS
- resolution: 256x128
- dynamic_range: 55 to 75.5 dB
- pixel_size: 10 μm
- dark_current: Not specified
Optical Data
- focal_length: Not specified
- aperture: Not specified
- field_of_view: Not specified
- distortion: Not specified
Performance Metrics
- noise: 0.31e-rms at minimum, 0.42e-rms at peak
Applications & Benefits
-
cell_imaging: Photon-counting capability with smooth
and clear photon-counting histogram
-
benefits: Adjustable conversion gain, full well
capacity, and dynamic range for different applications.
Supporting Organizations
-
supported_by: Dutch Government through the U-LONO
Project of TTS-NWO and the SENSATION Project of the Penta initiative.
Manuscript Details
Relevancy Score
- score: 10
-
missing_fields:
- focal_length
- aperture
- field_of_view
- distortion
- frame_rate
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- power_consumption
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