A Continuous Ramp Generator Design For Columnparallel Cmos Image Sensors Utilizing Novel Rowwise Noise Suppression Techniques

• doi: 10.1109/EIECC64539.2024.10929569
• title: A Continuous Ramp Generator Design for Column-Parallel CMOS Image Sensors Utilizing Novel Row-wise Noise Suppression Techniques
• publisher: IEEE
• isbn: 979-8-3315-3463-9
• issn:
• rank: 677
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents a novel continuous ramp generator designed for single-slope ADC (SS-ADC) architecture CMOS image sensors (CIS), with the aim of reducing row-wise noise. Based on traditional continuous ramp generators, two additional sampling capacitors are used to reduce the noise in the ramp reset voltage and the integration current, which can cause irregular horizontal stripes in images, especially in low-light conditions. By employing digital correlated double sampling (DCDS) techniques, the sampling capacitors sample the reset voltage and the current source bias voltage before the ramp voltage rises, ensuring that the conditions for generating the two ramp voltages are essentially the same, thereby suppressing the impact of noise fluctuations on the count value. Through the fabrication and testing of a CMOS image sensor using 350nm/55nm process, the proposed method has been proven to reduce row noise by 80%, demonstrating excellent row noise suppression performance.
• article_number: 10929569
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10929569
• html_url: https://ieeexplore.ieee.org/document/10929569/
• abstract_url: https://ieeexplore.ieee.org/document/10929569/
• publication_title: 2024 4th International Conference on Electronic Information Engineering and Computer Communication (EIECC)
• conference_location: Wuhan, China
• conference_dates: 27-29 Dec. 2024
• publication_number: 10929060
• is_number: 10928960
• publication_year: 2024
• publication_date: 27-29 Dec. 2024
• start_page: 520
• end_page: 525
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 12
• insert_date: 20250325
• index_terms:
  • ieee_terms:
    • Fabrication
    • Fluctuations
    • Noise
    • Noise reduction
    • Capacitors
    • Prototypes
    • CMOS image sensors
    • Generators
    • Testing
  • author_terms:
    • CMOS Image Sensor
    • SS-ADC
    • Continuous ramp generator
    • Row-wise noise reduction
  • dynamic_index_terms:
    • Noise Suppression
    • Active Noise Control
    • Noise-canceling
    • Ramp Generator
    • Noise Suppression Techniques
    • Count Data
    • Count Values
    • Current Source
    • Current Regulations
    • Bias Voltage
    • Capacity Of Samples
    • Low Light Conditions
    • Bias Current
    • Voltage Ramp
    • Reset Voltage
    • Input Signal
    • Random Noise
    • Channel Noise
    • Noise Sources
    • Impact Of Noise
    • Operational Amplifier
    • Op-amp
    • Digital Circuits
    • Digital Circuitry
    • Total Noise
    • Noise Test
    • Test Chip
    • Readout Circuit
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 979-8-3315-3463-9, isbnType: New-2005
  • format: USB ISBN, value: 979-8-3315-3461-5, isbnType: New-2005
  • format: Electronic ISBN, value: 979-8-3315-3462-2, isbnType: New-2005
• authors:
  • Author Name: Xiaoxuan Liu
    Affiliation: Xi’an Microelectronic Technology Institute, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/37090042862
    ID: 37090042862
    Order: 1
    Author Affiliations:
    • Xi’an Microelectronic Technology Institute, Xi’an, China
  • Author Name: Tianjiao Cao
    Affiliation: Xi’an Microelectronic Technology Institute, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/37090043878
    ID: 37090043878
    Order: 2
    Author Affiliations:
    • Xi’an Microelectronic Technology Institute, Xi’an, China
  • Author Name: Haisong Li
    Affiliation: Xi’an Microelectronic Technology Institute, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/37090042503
    ID: 37090042503
    Order: 3
    Author Affiliations:
    • Xi’an Microelectronic Technology Institute, Xi’an, China
  • Author Name: Ting Li
    Affiliation: Xi’an Microelectronic Technology Institute, Xi’an, China
    Author URL: https://ieeexplore.ieee.org/author/744649296856889
    ID: 744649296856889
    Order: 4
    Author Affiliations:
    • Xi’an Microelectronic Technology Institute, Xi’an, China

Image Sensor

• sensor_type: CMOS
• resolution: Not specified
• dynamic_range: Not specified
• pixel_size: Not specified
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

Applications & Benefits

• cell_imaging: Medical devices
• benefits: Digital imaging in various applications such as smartphones, medical devices, and automotive systems

Supporting Organizations

• supported_by: Not specified

Manuscript Details

• publication_date: 27-29 Dec. 2024

Relevancy Score

• score: 8
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption
  • noise
  • supported_by
  • authors
  • publication_date

Processed JSON Filename

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