A Compact 14Bit 110 Kss Twostage Incremental Adc For Cmos Image Sensors
- doi: 10.1109/MWSCAS.2017.8053139
-
title: A compact 14-bit 110 KS/s two-stage incremental
ΣΔ ADC for CMOS image sensors
- publisher: IEEE
- isbn: 978-1-5090-6390-1
- issn: 1558-3899
- rank: 1022
- access_type: LOCKED
- content_type: Conferences
-
abstract: The requirements for data conversion in CMOS
Image Sensors are increasing due to number and size of pixels and can
not be met anymore by classic ramp converters. To address this issue,
this paper presents a compact 14-bit two-stage Incremental-ΣΔ
column-parallel ADC for use in CMOS Image Sensors. The ADC as well as a
test array for a pixel matrix has been fabricated in a 110nm optical
CMOS process with a 3.3V supply. The first ADC stage is 5 bit
Incremental-ΣΔ, while the second stage is realized by reusing all
circuit elements in a cyclic ADC configuration. This way the ADC column
occupies an area of only 0.0029 mm2 and is layout with a fine pitch of
9.6 μm. At a speed of 110 KS/s it consumes 123 μW and achieves a DNL and
INL of +0.65/-0.83 LSB and +0.9/-0.81 LSB respectively.
- article_number: 8053139
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8053139
-
html_url:
https://ieeexplore.ieee.org/document/8053139/
-
abstract_url:
https://ieeexplore.ieee.org/document/8053139/
-
publication_title: 2017 IEEE 60th International Midwest
Symposium on Circuits and Systems (MWSCAS)
- conference_location: Boston, MA, USA
- conference_dates: 6-9 Aug. 2017
- publication_number: 8039346
- is_number: 8052834
- publication_year: 2017
- publication_date: 6-9 Aug. 2017
- start_page: 1180
- end_page: 1183
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 457
- insert_date: 20171002
-
index_terms:
-
ieee_terms:
- Capacitors
- Switches
- Clocks
- Image resolution
- CMOS image sensors
- Modulation
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Circuit Elements
- Electrical Elements
- Pixel Matrix
- Pixel Matrices
- Power Consumption
- Stages Of Cycle
- Input Signal
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Capacity Of Samples
- Extent Of Occurrence
- Area Of Occupancy
- Integration Of Inputs
- Clock Cycles
- Decision Level
- Capacitor C1
- Nyquist Rate
- Nyquist Sampling Rate
- Output Bits
- Delta-sigma
- Sigma-delta
- Integrator Output
- Voltage Feedback
- Capacitors C2
-
isbn_formats:
-
format: Print on Demand(PoD) ISBN,
value: 978-1-5090-6390-1,
isbnType: New-2005
-
format: USB ISBN,
value: 978-1-5090-6388-8,
isbnType: New-2005
-
format: Electronic ISBN,
value: 978-1-5090-6389-5,
isbnType: New-2005
-
authors:
-
Author Name: Francesco Giorgio
Affiliation: Department of Engineering Science,
University of Oxford
Author URL:
https://ieeexplore.ieee.org/author/37089406445
ID: 37089406445
Order: 1
Author Affiliations:
- Department of Engineering Science, University of Oxford
-
Author Name: Bhaskar Choubey
Affiliation: Department of Engineering Science,
University of Oxford
Author URL:
https://ieeexplore.ieee.org/author/37274571900
ID: 37274571900
Order: 2
Author Affiliations:
- Department of Engineering Science, University of Oxford
Image Sensor
- sensor_type: CMOS
- resolution: 400x400 pixels
- dynamic_range:
- pixel_size: 9.6 µm
- dark_current:
Optical Data
- focal_length:
- aperture:
- field_of_view:
- distortion:
Performance Metrics
- frame_rate: 30 fps
- signal_to_noise_ratio:
- sensitivity:
- shutter_speed:
- power_consumption: 123 µW
- noise:
Applications & Benefits
-
cell_imaging: This paper discusses the use of a 14-bit
two-stage Incremental ΣΔ ADC specifically designed for CMOS Image
Sensors, enabling efficient data conversion in sensitive imaging
applications.
-
benefits: Achieves high resolution (14-bits), low power
consumption (123 µW), compact area (0.0029 mm²), and allows faster image
capture (30 fps at full resolution).
Supporting Organizations
-
supported_by: European Commission, EDISON-GA project
Manuscript Details
- publication_date: 6-9 Aug. 2017
Relevancy Score
- score: 9
-
missing_fields:
- fill factor
- quantum efficiency
- noise sources
- readout speed
- microlenses
- on-chip colour filters
- global or rolling shutters
- backside illumination
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