A Cmos Lockin Pixel Image Sensor With Multisimultaneous Gate For Timeresolved Nearinfrared Spectroscopy

• doi: 10.1109/TED.2023.3236591
• title: A CMOS Lock-In Pixel Image Sensor With Multisimultaneous Gate for Time-Resolved Near-Infrared Spectroscopy
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 567
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: This article proposes a CMOS lock-in pixel image sensor aiming for time-resolved near-infrared spectroscopy (TR-NIRS). The pixel employs lateral electric field charge modulation (LEFM) with an eight-tap multisimultaneous gate structure and negative substrate bias. The optimization of pixel structure creates a high potential slope with no barrier to facilitate the high-speed photo-generated charge transfer required in the time-resolved application. The sensor employs a two-stage charge transfer architecture with pinned storage diodes (SDs). The effectiveness of the sensor is demonstrated through simulations and experimental measurements. A prototype sensor with 70 (V) $\times110$ (H) effective pixels to characterize the multisimultaneous gate lock-in pixel is implemented in a 0.11- $\mu \text{m}$ 1-poly-4-metal CMOS image sensor (CIS) technology. A fast intrinsic response of 240 ps is achieved using an 80-ps pulsewidth 780-nm laser diode by the characterization using two simultaneous gates and a single time window of the lock-in pixel. Performance evaluation using silicon phantoms and further measurement with a rat demonstrates the feasibility of the proposed sensor and setup for TR-NIRS applications.
• article_number: 10022008
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10022008
• html_url: https://ieeexplore.ieee.org/document/10022008/
• abstract_url: https://ieeexplore.ieee.org/document/10022008/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 10053598
• publication_year: 2023
• publication_date: March 2023
• start_page: 1102
• end_page: 1108
• citing_paper_count: 2
• citing_patent_count: 0
• download_count: 1125
• insert_date: 20230119
• index_terms:
  • ieee_terms:
    • Logic gates
    • Electric potential
    • Charge transfer
    • Substrates
    • Modulation
    • Electric fields
    • Doping
  • author_terms:
    • CMOS image sensor (CIS)
    • lateral electric field charge modulator (LEFM)
    • lock-in pixel
    • near-infrared spectroscopy (NIRS)
    • pinned photodiode (PPD)
    • time resolved
  • dynamic_index_terms:
    • Near-infrared Spectroscopy
    • Near-infrared Spectra
    • Image Sensor
    • Camera Sensor
    • Time-resolved Spectroscopy
    • Near-infrared Time-resolved Spectroscopy
    • Time Window
    • Fast Response
    • Faster Reaction
    • Pulse Width
    • Pulsewidth Modulation
    • Pulsewidth
    • Pulse Width Modulation
    • Diode Laser
    • Negative Bias
    • Negative Biases
    • Intrinsic Reaction
    • Intrinsic Response
    • Effective Pixel
    • Effect Of Sensor
    • Pixel Size
    • Low Voltage
    • Absorption Coefficient
    • Cerebral Blood Flow
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Light Pulses
    • Photomultiplier Tube
    • Instrument Response Function
    • Single-photon Avalanche Diode
    • Single Photon Avalanche Diode
    • Short Laser Pulses
    • PIN Photodiode
    • Phase-locked Loop
    • Phase Locked Loop
    • Time-correlated Single-photon Counting
    • TCSPC
    • Time-correlated Single Photon Counting
    • Central Pixel
    • Gate Set
    • Large Active Area
    • Potential Profile
• authors:
  • Author Name: De Xing Lioe
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37087469237
    ID: 37087469237
    Order: 1
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Yasuko Fukushi
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37089741328
    ID: 37089741328
    Order: 2
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    • Department of Innovative Medical Photonics, Preeminent Medical Photonics Education & Research Center, Hamamatsu University School of Medicine, Hamamatsu, Japan
  • Author Name: Masashi Hakamata
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088811430
    ID: 37088811430
    Order: 3
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Masatsugu Niwayama
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37275992300
    ID: 37275992300
    Order: 4
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Kamel Mars
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38076268000
    ID: 38076268000
    Order: 5
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Keita Yasutomi
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37680557800
    ID: 37680557800
    Order: 6
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Keiichiro Kagawa
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37278023200
    ID: 37278023200
    Order: 7
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Seiji Yamamoto
    Affiliation: Education & Collaboration Development, Hamamatsu University School of Medicine, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37402630800
    ID: 37402630800
    Order: 8
    Author Affiliations:
    • Education & Collaboration Development, Hamamatsu University School of Medicine, Hamamatsu, Japan
  • Author Name: Shoji Kawahito
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37300195700
    ID: 37300195700
    Order: 9
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 70 (V) × 110 (H) effective pixels
• dynamic_range: Not specified in the text
• pixel_size: 22.4 × 22.4 µm
• dark_current: Not specified in the text

Optical Data

• focal_length: Not specified in the text
• aperture: Not specified in the text
• field_of_view: Not specified in the text
• distortion: Not specified in the text

Performance Metrics

• frame_rate: Not specified in the text
• signal_to_noise_ratio: Not specified in the text
• sensitivity: Not specified in the text
• shutter_speed: Not specified in the text
• power_consumption: Not specified in the text
• noise: Not specified in the text

Applications & Benefits

• cell_imaging: Near-infrared spectroscopy (NIRS) applications, non-invasive monitoring of blood oxygenation, and imaging in biomedical fields.
• benefits: Ability to distinguish absorption coefficients in time-resolved applications, facilitating real-time continuous monitoring of brain activity.

Supporting Organizations

• supported_by: Japan Society for the Promotion of Science (JSPS), Japan Science and Technology Agency (JST) Center of Innovation (COI), Adaptable and Seamless Technology transfer Program, VLSI Design and Education Center (VDEC)

Manuscript Details

• publication_date: March 2023

Relevancy Score

• score: 10
• missing_fields:
  • dynamic_range
  • dark_current
  • noise
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_2333ea66-f2cb-42ea-b844-094665862df1-a_cmos_lockin_pixel_image_sensor_with_multisimultaneous_gate_for_timeresolved_nearinfrared_spectroscopy.json