A Cmos Imager With Onchip Variable Resolution For Lightadaptive Imaging

• doi: 10.1109/ISSCC.1998.672422
• title: A CMOS imager with on-chip variable resolution for light-adaptive imaging
• publisher: IEEE
• isbn: 0-7803-4344-1
• issn: 0193-6530
• partnum: 98CH36156
• rank: 629
• access_type: LOCKED
• content_type: Conferences
• abstract: In addition to advantages of lower power and system miniaturization through camera-on-a-chip implementation, the CMOS active pixel image sensor (APS) enables development of smart imagers by integrating custom CMOS signal processing circuits on the focal plane. This CMOS APS imager is capable of enhancing signal to noise ratio (S/N) under low illumination through summation of signals from neighboring pixels. On-chip S/N improvement in CMOS APS is demonstrated by pixel averaging or by pixel binning. Pixel binning is implemented in a CMOS APS primarily designed for frame-transfer. That implementation suffers from extraneous noise pick-up and high-residual fixed-pattern noise (FPN) due to the use of single-ended column integrator. This APS has improved kernel summing circuits implemented in fully-differential topology. The imager performance is improved by greatly reducing FPN and temporal circuit noise. This multi-resolution APS is suited for application in light-level-adaptive imaging.
• article_number: 672422
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=672422
• html_url: https://ieeexplore.ieee.org/document/672422/
• abstract_url: https://ieeexplore.ieee.org/document/672422/
• publication_title: 1998 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, ISSCC. First Edition (Cat. No.98CH36156)
• conference_location: San Francisco, CA, USA
• conference_dates: 5-7 Feb. 1998
• publication_number: 5508
• is_number: 14797
• publication_year: 1998
• publication_date: 5-7 Feb. 1998
• start_page: 174
• end_page: 175
• citing_paper_count: 10
• citing_patent_count: 67
• download_count: 276
• insert_date: 20020806
• index_terms:
  • ieee_terms:
    • Image resolution
    • CMOS image sensors
    • Circuit noise
    • CMOS process
    • Signal resolution
    • Smart pixels
    • Image sensors
    • Signal processing
    • Signal to noise ratio
    • Lighting
  • dynamic_index_terms:
    • Common Mode
    • Sensor Pixel
    • Capacitance Ratio
• isbn_formats:
  • format: Print ISBN, value: 0-7803-4344-1, isbnType: Historical
• authors:
  • Author Name: Z. Zhou
    Affiliation: CondorVision Technology, Inc., Fremont, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37615095400
    ID: 37615095400
    Order: 1
    Author Affiliations:
    • CondorVision Technology, Inc., Fremont, CA, USA
  • Author Name: B. Pain
    Affiliation: California Institute of Technology, Pasadena, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37326642900
    ID: 37326642900
    Order: 2
    Author Affiliations:
    • California Institute of Technology, Pasadena, CA, USA
  • Author Name: E. Fossum
    Affiliation: Photobit, Inc., La Crescenta, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37326789400
    ID: 37326789400
    Order: 3
    Author Affiliations:
    • Photobit, Inc., La Crescenta, CA, USA

Image Sensor

• sensor_type: CMOS
• resolution: 128x128
• dynamic_range: 72 dB
• pixel_size: 24x24 m
• dark_current: 0.6 nA/cm2

Optical Data

• focal_length: N/A
• aperture: N/A
• field_of_view: N/A
• distortion: N/A

Performance Metrics

• frame_rate: 125 fps
• signal_to_noise_ratio: > 10 dB
• sensitivity: N/A
• shutter_speed: N/A
• power_consumption: 24 mW
• noise: 320 pV

Applications & Benefits

• cell_imaging: Light-adaptive imaging applications in medical devices and other sensors using variable resolution.
• benefits: Lower power consumption and improved signal-to-noise ratio in low illumination conditions.

Supporting Organizations

• supported_by: NASA, Office of Advanced Concepts and Technology

Manuscript Details

• publication_date: 5-7 Feb. 1998

Relevancy Score

• score: 10

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