A Cmos Image Sensor With Local Brightness Adaptation And High Intrascene Dynamic Range

• doi: 10.1109/ESSCIR.1998.186270
• title: A CMOS image sensor with local brightness adaptation and high intrascene dynamic range
• publisher: IEEE
• isbn:
• issn:
• rank: 613
• access_type: LOCKED
• content_type: Conferences
• abstract: An integrated CMOS image sensor with 128×128 pixels and local brightness adaptation suitable for machine vision and surveillance applications has been developed and successfully tested. Local brightness adaptation is achieved by dividing the input photocurrent of each sensor pixel by its local average. Since the irradiance at the imager is based on a nonlinear multiplicative combination of scene illumination and object surface reflectance, the output signal of the imager will depend only on the visually relevant reflectance component if the illumination does not significantly vary within the averaging area. The computation of local average is realized by spatial low-pass filtering the input photocurrent distribution using a 2D pseudo-resistive diffusion network. Division by local average inside each pixel is based on a translinear divider. The chip has been realized in a 1 µm n-well standard CMOS process. The pixel pitch is 53,4 µm and the total chip area is 68 mm2.
• article_number: 1471027
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1471027
• html_url: https://ieeexplore.ieee.org/document/1471027/
• abstract_url: https://ieeexplore.ieee.org/document/1471027/
• publication_title: Proceedings of the 24th European Solid-State Circuits Conference
• conference_location: The Hague, Netherlands
• conference_dates: 22-24 Sept. 1998
• publication_number: 9917
• is_number: 31526
• publication_year: 1998
• publication_date: 22-24 Sept. 1998
• start_page: 308
• end_page: 311
• citing_paper_count: 6
• citing_patent_count: 0
• download_count: 136
• insert_date: 20050801
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Brightness
    • Dynamic range
    • Photoconductivity
    • Lighting
    • Reflectivity
    • Pixel
    • Machine vision
    • Surveillance
    • Testing
  • dynamic_index_terms:
    • Dynamic Range
    • Local Adaptation
    • Image Sensor
    • Camera Sensor
    • Brightness Adaptation
    • Pixel Pitch
    • Low-pass
    • Low-pass Filter
    • Input Image
    • Impulse Response
    • Average Position
    • Average Location
    • Cell Yield
    • Cell Output
    • Sheet Of Paper
    • Signal Energy
    • Object Surface
    • Input Current
    • Network Diffusion
    • Dispersed Network
    • Dissemination Network
    • Weak Inverse
    • Reflection Component
    • Gate-source Voltage
    • Readout Electronics
    • Current Mirror
• authors:
  • Author Name: R. Hauschild
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37347011400
    ID: 37347011400
    Order: 1
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
  • Author Name: M. Hillebrand
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37425930200
    ID: 37425930200
    Order: 2
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
  • Author Name: B.J. Hosticka
    Affiliation:
    Author URL: https://ieeexplore.ieee.org/author/37275079700
    ID: 37275079700
    Order: 3
    
  • Author Name: J. Huppertz
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37331483800
    ID: 37331483800
    Order: 4
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
  • Author Name: T. Kneip
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37374927700
    ID: 37374927700
    Order: 5
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
  • Author Name: M. Schwarz
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37357836300
    ID: 37357836300
    Order: 6
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and System, Duisburg, Germany

Image Sensor

• sensor_type: CMOS
• resolution: 128x128 pixels
• dynamic_range: 26 dB
• pixel_size: 53.4 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• noise: High fixed pattern noise (up to 100mV offset between sensor cells)

Applications & Benefits

• cell_imaging: Suitable for machine vision and surveillance applications
• benefits: Local brightness adaptation and high intrascene dynamic range

Supporting Organizations

• supported_by: Fraunhofer Institute of Microelectronic Circuits and Systems

Manuscript Details

• publication_date: 22-24 Sept. 1998

Relevancy Score

• score: 10
• missing_fields:
  • quantum_efficiency
  • readout_speed
  • noise_sources
  • analog_to_digital_conversion_techniques
  • use_of_microlenses
  • on_chip_colour_filters
  • global_or_rolling_shutters
  • backside_illumination

Processed JSON Filename

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