A Cmos Image Sensor With Improved Readout Speed Using Column Sar Adc With Digital Error Correction

• doi: 10.1109/ISCAS.2019.8702292
• title: A CMOS Image Sensor with Improved Readout Speed using Column SAR ADC with Digital Error Correction
• publisher: IEEE
• isbn: 978-1-7281-0397-6
• issn: 2158-1525
• rank: 556
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper proposes a CMOS image sensor (CIS) whose readout speed is improved by 33%, through applying a digital error correction (DEC) method to its column-level successive approximation register (SAR) analog to digital converters (ADC), compared to an alternative without using the DEC technique. The proposed addition-only DEC alleviates the ADC's incomplete settling errors, hence improving conversion rate while maintaining accuracy. It is based on a binary bridged SAR architecture with 4 redundant capacitors and conversion cycles, which ensure the ADC's linearity of 10 bit within a 5 bit accuracy's settling time. Simulation results show the DEC method improves the ADC's static and dynamic linearity, eliminating its missing codes and increasing its signal to noise plus distortion ratio (SNDR) from 64.5 dB to 67.5 dB, when operating at the same sampling speed. The proposed SAR keeps the same straightforward timing diagram as that in a conventional SAR ADC, incurring no offset to the ADC, while increasing the sampling rate by 33%. The simulated linearity of the prototype CIS is within ±0.07%, when sampled at a column readout rate of 10 MHz.
• article_number: 8702292
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8702292
• html_url: https://ieeexplore.ieee.org/document/8702292/
• abstract_url: https://ieeexplore.ieee.org/document/8702292/
• publication_title: 2019 IEEE International Symposium on Circuits and Systems (ISCAS)
• conference_location: Sapporo, Japan
• conference_dates: 26-29 May 2019
• publication_number: 8682239
• is_number: 8702066
• publication_year: 2019
• publication_date: 26-29 May 2019
• start_page: 1
• end_page: 5
• citing_paper_count: 3
• citing_patent_count: 0
• download_count: 1194
• insert_date: 20190501
• index_terms:
  • ieee_terms:
    • Electronics packaging
    • Capacitors
    • Linearity
    • Timing
    • Simulation
    • Gain
    • Capacitance
  • author_terms:
    • CMOS image sensor
    • digital error correction
    • successive approximation register
    • analog-to-digital converter
    • SAR
    • ADC
    • DEC
  • dynamic_index_terms:
    • Readout Speed
    • Digital Error Correction
    • Simulation Results
    • Sampling Rate
    • Conversion Rate
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Settling Time
    • Colonial Times
    • Linear Dynamics
    • Monte Carlo Simulation
    • Monte Carlo Method
    • Previous Publications
    • Photodiode
    • Photocurrent
    • Power Efficiency
    • Cadence
    • Quantization Error
    • Amount Of Error
    • Sine Wave
    • Sine-wave
    • Charge Balance
    • Parasitic Capacitance
    • Small Capacity
    • Small Capacitance
    • Conversion Time
    • Continuous Output
    • MATLAB Simulation
    • Output Pixel
• isbn_formats:
  • format: Print ISBN, value: 978-1-7281-0397-6, isbnType: New-2005
• authors:
  • Author Name: Shuang Xie
    Affiliation: EI Lab, Delft University of Technology, the Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37086323943
    ID: 37086323943
    Order: 1
    Author Affiliations:
    • EI Lab, Delft University of Technology, the Netherlands
  • Author Name: Albert Theuwissen
    Affiliation: EI Lab, Delft University of Technology, the Netherlands
    Author URL: https://ieeexplore.ieee.org/author/37282956500
    ID: 37282956500
    Order: 2
    Author Affiliations:
    • EI Lab, Delft University of Technology, the Netherlands

Image Sensor

• sensor_type: CMOS
• resolution: 10-bit
• dynamic_range: greater than 62 dB
• pixel_size: 11 µm
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 10 MHz
• signal_to_noise_ratio: 67.5 dB
• power_consumption: 130 µA (comparator), 145 µA (PGA)
• noise: 150 µV

Applications & Benefits

• cell_imaging: not specified
• benefits: Improved readout speed by 33%, improved SNDR, and nonlinearity less than 0.07%.

Supporting Organizations

• supported_by: Dutch government and the EC

Manuscript Details

• publication_date: 26-29 May 2019

Relevancy Score

• score: 8
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed

Processed JSON Filename

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