A Cmos Image Sensor Based On Unified Pixel Architecture With Timedivision Multiplexing Scheme For Color And Depth Image Acquisition

• doi: 10.1109/JSSC.2012.2214179
• title: A CMOS Image Sensor Based on Unified Pixel Architecture With Time-Division Multiplexing Scheme for Color and Depth Image Acquisition
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 541
• access_type: LOCKED
• content_type: Journals
• abstract: We propose a CMOS image sensor with time-division multiplexing pixel architecture using standard pinned-photodiode for capturing 2-D color image as well as extracting 3-D depth information of a target object. The proposed pixel can alternately provide both color and depth images in each frame. Two split photodiode and four transfer gates in each pixel improve the transfer speed of generated electrons to be capable of demodulating a high-frequency time-of-flight signal. In addition, four-shared pixel architecture acquires a color image with high spatial resolution and generates a reliable depth map by inherent binning operation in charge domain. A 712 496 pixel array has been fabricated using a 0.11μm standard CMOS imaging process and fully characterized. A 6m pixel with 34.5% aperture ratio can be operated at 10-MHz modulation frequency with 70% demodulation contrast. We have successfully captured both images of exactly same scene from the fabricated test chip. It shows a depth uncertainty of less than 60 mm and a linearity error of about 2% between 1 and 3 m distance with 50-ms integration time. Moreover, high-gain readout operation enables to improve the performance, achieving about 43-mm depth uncertainty at 3 m.
• article_number: 6327619
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6327619
• html_url: https://ieeexplore.ieee.org/document/6327619/
• abstract_url: https://ieeexplore.ieee.org/document/6327619/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 6339059
• publication_year: 2012
• publication_date: Nov. 2012
• start_page: 2834
• end_page: 2845
• citing_paper_count: 57
• citing_patent_count: 28
• download_count: 2787
• insert_date: 20121009
• index_terms:
  • ieee_terms:
    • Logic gates
    • Image color analysis
    • Color
    • Arrays
    • Standards
    • Demodulation
    • CMOS image sensors
  • author_terms:
    • Binning operation
    • charge transfer speed
    • CMOS image sensor
    • demodulation pixel
    • depth sensor
    • four-shared architecture
    • high-gain readout
    • multiresolution
    • range finding
    • standard pinned-photodiode
    • three-dimensional (3-D) image sensor
    • time-division
    • time-of-flight (TOF)
  • dynamic_index_terms:
    • Color Images
    • Image Sensor
    • Camera Sensor
    • Depth Images
    • Time-division Multiplexing
    • Spatial Resolution
    • Integration Time
    • Modulation Frequency
    • Target Object
    • Depth Map
    • Function Of Depth
    • Depth Information
    • Pixel Array
    • Transfer Speed
    • Standard CMOS
    • Raw Data
    • Pixel Size
    • 3D Images
    • Slow Speed
    • Imaging Device
    • Depth Data
    • Single-photon Avalanche Diode
    • Sensor Prototype
    • Dual Operation
    • IR Light
    • Time-to-digital Converter
    • Storage Nodes
    • Pixel Color
    • Color Of Each Pixel
    • Colour Pixels
    • Types Of Pixels
    • Conversion Gain
    • Image Processing Algorithms
• authors:
  • Author Name: Seong-Jin Kim
    Affiliation: Institute of Microelectronics, Agency for Science, Technology and Research, Singapore
    Author URL: https://ieeexplore.ieee.org/author/38183923800
    ID: 38183923800
    Order: 1
    Author Affiliations:
    • Institute of Microelectronics, Agency for Science, Technology and Research, Singapore
    • Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
  • Author Name: James D. K. Kim
    Affiliation: Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
    Author URL: https://ieeexplore.ieee.org/author/38491134900
    ID: 38491134900
    Order: 2
    Author Affiliations:
    • Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
  • Author Name: Byongmin Kang
    Affiliation: Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37537058700
    ID: 37537058700
    Order: 3
    Author Affiliations:
    • Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
  • Author Name: Keechang Lee
    Affiliation: Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea
    Author URL: https://ieeexplore.ieee.org/author/37540313800
    ID: 37540313800
    Order: 4
    Author Affiliations:
    • Advanced Media Laboratory, Samsung Advanced Institute of Technology, Yongin si, South Korea

Image Sensor

• sensor_type: CMOS
• resolution: 712496 pixels
• dynamic_range: not specified
• pixel_size: 6 µm
• dark_current: not specified

Optical Data

• focal_length: 6.5 mm
• aperture: 34.5%
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 18 fps (color), 6.4 fps (depth)
• shutter_speed: 50 ms
• power_consumption: 53 mW (color), 352 mW (depth)
• noise: depth uncertainty less than 60 mm with standard reading, 43 mm with high gain readout

Applications & Benefits

• cell_imaging: The sensor is capable of capturing both color and depth images for applications in robotics, security, automotive, and interactive gaming.
• benefits: Enables real-time 3-D image capturing and depth extraction without complicated postprocessing.

Supporting Organizations

• supported_by: Samsung Advanced Institute of Technology, A*STAR, Singapore

Manuscript Details

• publication_date: Nov. 2012

Relevancy Score

• score: 10
• missing_fields:
  • quantum efficiency
  • readout speed
  • noise sources
  • analog-to-digital conversion techniques
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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