A Cmos Activepixel Image Sharpness Sensor

• doi: 10.1109/MWSCAS.2014.6908569
• title: A CMOS active-pixel image sharpness sensor
• publisher: IEEE
• isbn: 978-1-4799-4134-6
• issn: 1558-3899
• rank: 583
• access_type: LOCKED
• content_type: Conferences
• abstract: The technique of maximizing image sharpness is a powerful means of adaptively correcting phase aberrations in wavefronts. Crucial to this correction is a sensor that provides an accurate real-time estimate of image sharpness. In this paper, we introduce a novel image sharpness sensor using CMOS active pixel technology that computes image sharpness at a sample rate of 7.8 kHz. The sharpness sensor contains a 40×40 pixel array and is fabricated in a 0.5-μm CMOS process through MOSIS. Power consumption is 12 mW. Each pixel is 24.5 × 24.5 μm2 with a fill factor of 20%. Experimental results obtained under open-loop static conditions show that the output value changes by 87.5% when the sensor is moved 1 cm away from the 50-cm focal point. This sensor finds potential applications in closed-loop adaptive optics systems.
• article_number: 6908569
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6908569
• html_url: https://ieeexplore.ieee.org/document/6908569/
• abstract_url: https://ieeexplore.ieee.org/document/6908569/
• publication_title: 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS)
• conference_location: College Station, TX, USA
• conference_dates: 3-6 Aug. 2014
• publication_number: 6900043
• is_number: 6908326
• publication_year: 2014
• publication_date: 3-6 Aug. 2014
• start_page: 933
• end_page: 936
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 173
• insert_date: 20140925
• index_terms:
  • ieee_terms:
    • Adaptive optics
    • Measurement
    • Transistors
    • CMOS integrated circuits
    • Lenses
    • Laser beams
    • Threshold voltage
  • author_terms:
    • Image sharpness
    • CMOS image sensor
    • active-pixel
    • adaptive optics
    • wavefront sensor
    • image quality metric
  • dynamic_index_terms:
    • Image Sharpness
    • Output Value
    • Yield Values
    • Static Conditions
    • Pixel Array
    • Adaptive Optics
    • Image Quality
    • Objective Lens
    • Objective Lenses
    • Microscope Objective
    • Laser Beam
    • Integration Time
    • Photodiode
    • Voltage Drop
    • Potential Drop
    • IR Drop
    • Photocurrent
    • Bias Voltage
    • Output Current
    • Threshold Voltage
    • Clock Rate
    • Clock Speed
    • Processor Speed
    • Bias Current
    • Collimated Beam
    • Collimated Light
    • Clock Frequency
    • Wavefront Aberrations
    • Atmospheric Turbulence
    • Readout Scheme
    • Readout Strategy
    • Control Circuitry
    • Incident Flux
• isbn_formats:
  • format: Print ISBN, value: 978-1-4799-4134-6, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4799-4132-2, isbnType: New-2005
• authors:
  • Author Name: Aditya Rayankula
    Affiliation: Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA
    Author URL: https://ieeexplore.ieee.org/author/38059013800
    ID: 38059013800
    Order: 1
    Author Affiliations:
    • Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA
  • Author Name: Paul M. Furth
    Affiliation: Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA
    Author URL: https://ieeexplore.ieee.org/author/37269443200
    ID: 37269443200
    Order: 2
    Author Affiliations:
    • Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA

Image Sensor

• sensor_type: CMOS
• resolution: 40x40 pixel
• dynamic_range: Not specified
• pixel_size: 24.5 x 24.5 μm2
• dark_current: Not specified

Optical Data

• focal_length: 50 cm
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 7.8 kHz
• power_consumption: 12 mW

Applications & Benefits

• cell_imaging: Used in closed-loop adaptive optics systems to correct wavefront aberrations for improved image sharpness.
• benefits: The sensor allows fast off-chip processing and operates at very low illumination levels.

Supporting Organizations

• supported_by: MOSIS

Manuscript Details

• publication_date: 3-6 Aug. 2014

Relevancy Score

• score: 8
• missing_fields:
  • dynamic_range
  • dark_current
  • sensitivity
  • shutter_speed
  • signal_to_noise_ratio
  • noise
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

request_5db5e5b5-2322-4e27-ad9a-1050b5394ec4-a_cmos_activepixel_image_sharpness_sensor.json