A Blockparallel Adc With Digital Noise Cancelling For 3D Stacked Cmos
Image Sensor
- doi: 10.1109/3DIC.2013.6702363
-
title: A block-parallel ADC with digital noise
cancelling for 3-D stacked CMOS image sensor
- publisher: IEEE
- isbn: 978-1-4673-6484-3
- issn:
- rank: 1010
- access_type: LOCKED
- content_type: Conferences
-
abstract: An ADC design with a hierarchical double
correlated double sampling for a three-dimensional (3-D) stacked CMOS
image sensor is presented in this paper. To realize high speed, high
resolution, and high sensitivity, we have proposed a blockparallel
signal processing with 3-D structure. The block-parallel analog signal
processing elements which compose CMOS image sensor, correlated double
sampling (CDS) with programmable gain amplifier (PGA) array, and
analog-to-digital converter (ADC) array. Spatial noise is the main
contributor of image distortion in CMOS image sensor. Fixed pattern
noise (FPN) does not change with time, and causes fixed distortion
pattern on the image, hence FPN correction is especially challenging in
the high speed CMOS image sensor. In the proposed sensor system, FPN of
pixel output is removed by analog CDS. The digital CDS proposed in this
paper is used to eliminate FPN caused by the device variation of analog
circuits. The proposed ADC was designed with 90-nm CMOS technology. The
proposed ADC with digital CDS occupies a very small circuit area of
160×160μm2. The block-parallel ADC performance is characterized through
differential nonlinearity (DNL) and integral nonlinearity (INL)
measurements. The DNL is within -1.49/+1.89 LSB, and the INL is
-1.92/+2.44 LSB, respectively. FPN is reduced to the range of ±1LSB by
using proposed hierarchical double CDS function.
- article_number: 6702363
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6702363
-
html_url:
https://ieeexplore.ieee.org/document/6702363/
-
abstract_url:
https://ieeexplore.ieee.org/document/6702363/
-
publication_title: 2013 IEEE International 3D Systems
Integration Conference (3DIC)
- conference_location: San Francisco, CA, USA
- conference_dates: 2-4 Oct. 2013
- publication_number: 6690582
- is_number: 6702313
- publication_year: 2013
- publication_date: 2-4 Oct. 2013
- start_page: 1
- end_page: 4
- citing_paper_count: 3
- citing_patent_count: 0
- download_count: 669
- insert_date: 20140109
-
index_terms:
-
ieee_terms:
- CMOS image sensors
- CMOS integrated circuits
- Signal processing
- Arrays
- CMOS technology
- Electronics packaging
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Signal Processing
- High Speed
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- CMOS Technology
- Spatial Noise
- Circuit Area
- Power Consumption
- Digital Signal
- Set Of Units
- High Frame Rate
- High-speed Imaging
- Digital Circuits
- Digital Circuitry
- Offset Voltage
- Image Processing System
- Standard CMOS
-
isbn_formats:
-
format: Electronic ISBN,
value: 978-1-4673-6484-3,
isbnType: New-2005
-
authors:
-
Author Name: K. Kiyoyama
Affiliation: Dept. of Electrical and Electronics
Engineering, Nagasaki Institute of Applied Science, Nagasaki,
Japan
Author URL:
https://ieeexplore.ieee.org/author/37327656500
ID: 37327656500
Order: 1
Author Affiliations:
-
Dept. of Electrical and Electronics Engineering, Nagasaki
Institute of Applied Science, Nagasaki, Japan
-
Author Name: Y. Sato
Affiliation: New Industry Creation Hatchery Center,
Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/37290223300
ID: 37290223300
Order: 2
Author Affiliations:
-
New Industry Creation Hatchery Center, Tohoku University, Japan
-
Author Name: H. Hashimoto
Affiliation: New Industry Creation Hatchery Center,
Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/38569020700
ID: 38569020700
Order: 3
Author Affiliations:
-
New Industry Creation Hatchery Center, Tohoku University, Japan
-
Author Name: K-W Lee
Affiliation: New Industry Creation Hatchery Center,
Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/37407640200
ID: 37407640200
Order: 4
Author Affiliations:
-
New Industry Creation Hatchery Center, Tohoku University, Japan
-
Author Name: T. Fukushima
Affiliation: New Industry Creation Hatchery Center,
Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/37396820300
ID: 37396820300
Order: 5
Author Affiliations:
-
New Industry Creation Hatchery Center, Tohoku University, Japan
-
Author Name: T. Tanaka
Affiliation: Graduate School of Biomedical
Engineering, Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/37403329200
ID: 37403329200
Order: 6
Author Affiliations:
-
Graduate School of Biomedical Engineering, Tohoku University,
Japan
-
Author Name: M. Koyanagi
Affiliation: New Industry Creation Hatchery Center,
Tohoku University, Japan
Author URL:
https://ieeexplore.ieee.org/author/37283392400
ID: 37283392400
Order: 7
Author Affiliations:
-
New Industry Creation Hatchery Center, Tohoku University, Japan
Image Sensor
- sensor_type: CMOS
- resolution: 352×288
- dynamic_range: unknown
- pixel_size: unknown
- dark_current: unknown
Optical Data
- focal_length: unknown
- aperture: unknown
- field_of_view: unknown
- distortion: unknown
Performance Metrics
- frame_rate: 10000 fps
- signal_to_noise_ratio: 44.5 dB
- sensitivity: unknown
- shutter_speed: global shutter
- power_consumption: 387 ȝW
- noise: ±1 LSB
Applications & Benefits
-
cell_imaging: High-speed image capturing in
applications such as smartphones, medical devices, and automotive
systems.
-
benefits: High resolution and high-speed digital data
readout.
Supporting Organizations
-
supported_by: NEDO, University of Tokyo, Synopsys Inc,
Cadence Design System Inc, Mentor Graphics Inc.
Manuscript Details
- publication_date: 2-4 Oct. 2013
Relevancy Score
- score: 10
-
missing_fields:
- fill factor
- quantum efficiency
- readout speed
- temporal noise
Processed JSON Filename
request_2169c91e-b4fa-45b6-bdab-792bafffc9b4-a_blockparallel_adc_with_digital_noise_cancelling_for_3d_stacked_cmos_image_sensor.json