A 5Mhz Lownoise 130Nm Cmos Analog Frontend Electronics For The Readout Of Nonlinear Depfet Sensor With Signal Compression For The European Xfel

• doi: 10.1109/NSSMIC.2010.5873733
• title: A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL
• publisher: IEEE
• isbn: 978-1-4244-9104-9
• issn: 1082-3654
• partnum: 10CH38792
• rank: 472
• access_type: LOCKED
• content_type: Conferences
• abstract: We present an integrated analog front-end for the readout of a non-linear DEPFET Sensor with Signal Compression (DSSC). The DSSC system, currently under development, is a 1-Mega pixel detector system for the European X-ray Free Electron Laser (XFEL) in Hamburg. It will record X-ray images with a maximum frame rate of 4.5MHz and will achieve at the same time a single photon resolution at 1keV and a high dynamic range. Two different readout strategies of the DEPFET pixel, Source Follower (SF) and Drain Readout (DR), have been fabricated in the 1.2V 0.13μm IBM CMOS technology. Both solutions share the same analog filter based on a new architecture that implements a trapezoidal shaping function employing only one operational amplifier. In this paper, the architecture of the analog front-end relative to both the readout strategies and of the new designed filter and the performance of the test chips are presented.
• article_number: 5873733
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5873733
• html_url: https://ieeexplore.ieee.org/document/5873733/
• abstract_url: https://ieeexplore.ieee.org/document/5873733/
• publication_title: IEEE Nuclear Science Symposium & Medical Imaging Conference
• conference_location: Knoxville, TN, USA
• conference_dates: 30 Oct.-6 Nov. 2010
• publication_number: 5779755
• is_number: 5873695
• publication_year: 2010
• publication_date: 30 Oct.-6 Nov. 2010
• start_page: 139
• end_page: 144
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 236
• insert_date: 20110613
• index_terms:
  • ieee_terms:
    • Semiconductor device measurement
    • Current measurement
    • Noise
    • Pixel
    • Dynamic range
    • Logic gates
    • Photonics
  • dynamic_index_terms:
    • X-ray Free-electron Laser
    • Signal Compression
    • Nonlinear Sensor
    • Dynamic Range
    • Single Resolution
    • High Dynamic Range
    • Operational Amplifier
    • Op-amp
    • Test Chip
    • Analog Filter
    • Readout Scheme
    • Readout Strategy
    • Trapezoidal Function
    • Baseline Measurements
    • Voltage-gated
    • Gate Voltage
    • Input Signal
    • Current Source
    • Current Regulations
    • Weight Function
    • Dominant Source
    • Supply Voltage
    • Input Stage
    • X-ray Pulses
    • Input Filter
    • Flicker Noise
    • Serial Peripheral Interface
    • RAM Memory
    • Shift Register
    • Filtering Stage
• isbn_formats:
  • format: CD, value: 978-1-4244-9104-9, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-9106-3, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-4244-9105-6, isbnType: New-2005
• authors:
  • Author Name: Giulio De Vita
    Affiliation: Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    Author URL: https://ieeexplore.ieee.org/author/37396203000
    ID: 37396203000
    Order: 1
    Author Affiliations:
    • Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    • MPI Halbleiterlabor, Munich, Germany
  • Author Name: Luca Bombelli
    Affiliation: Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
    Author URL: https://ieeexplore.ieee.org/author/37296181100
    ID: 37296181100
    Order: 2
    Author Affiliations:
    • Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
  • Author Name: Matteo Porro
    Affiliation: Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    Author URL: https://ieeexplore.ieee.org/author/37272098200
    ID: 37272098200
    Order: 3
    Author Affiliations:
    • Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    • MPI Halbleiterlabor, Munich, Germany
  • Author Name: Sven Herrmann
    Affiliation: Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    Author URL: https://ieeexplore.ieee.org/author/37269241500
    ID: 37269241500
    Order: 4
    Author Affiliations:
    • Max Planck Institut für Extraterrestrische Physik, Garching, Germany
    • MPI Halbleiterlabor, Munich, Germany
  • Author Name: Andreas Wassatsch
    Affiliation: MPI Halbleiterlabor, Munich, Germany
    Author URL: https://ieeexplore.ieee.org/author/37371725500
    ID: 37371725500
    Order: 5
    Author Affiliations:
    • MPI Halbleiterlabor, Munich, Germany
    • Max Planck Institut für Physik, Munich, Germany
  • Author Name: Stefano Facchinetti
    Affiliation: Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
    Author URL: https://ieeexplore.ieee.org/author/37703932200
    ID: 37703932200
    Order: 6
    Author Affiliations:
    • Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
  • Author Name: Carlo Fiorini
    Affiliation: Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
    Author URL: https://ieeexplore.ieee.org/author/37278095900
    ID: 37278095900
    Order: 7
    Author Affiliations:
    • Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
  • Author Name: Florian Erdinger
    Affiliation: Institute of Computer Engineering, University of Heidelberg, Mannheim, Germany
    Author URL: https://ieeexplore.ieee.org/author/37703932600
    ID: 37703932600
    Order: 8
    Author Affiliations:
    • Institute of Computer Engineering, University of Heidelberg, Mannheim, Germany

Image Sensor

• sensor_type: DEPFET
• resolution: 1 Mega pixel
• dynamic_range: 6000 photons at 1 keV
• pixel_size: 229 x 224 μm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 4.5 MHz
• noise: 13 e- to 48 e- r.m.s.

Applications & Benefits

• cell_imaging: The DSSC detector system is intended for X-ray imaging applications at the European XFEL.
• benefits: High dynamic range and single photon resolution at 1 keV.

Supporting Organizations

• supported_by: Max-Planck Institute for Physics, Politecnico di Milano, Italian National Institute of Nuclear Physics (INFN), University of Heidelberg

Manuscript Details

• publication_date: 30 Oct.-6 Nov. 2010

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed
  • power_consumption

Processed JSON Filename

request_381a4cd1-66c1-4eed-b9d5-0dede2789b87-a_5mhz_lownoise_130nm_cmos_analog_frontend_electronics_for_the_readout_of_nonlinear_depfet_sensor_with_signal_compression_for_the_european_xfel.json