A 40Mwchannel Image Sensor Line Driver Ic With Independently Tunable Gain And Settling Time

• doi: 10.1109/NSS/MIC42101.2019.9059766
• title: A 40mW/channel Image Sensor Line Driver IC with Independently Tunable Gain and Settling Time
• publisher: IEEE
• isbn: 978-1-7281-4165-7
• issn: 1082-3654
• rank: 451
• access_type: LOCKED
• content_type: Conferences
• abstract: A 16-channel analog front-end integrated circuit (IC) for interfacing an image sensor with single-ended analog output to a differential-input digitizer is presented. The IC is designed for image sensors used in single-electron counting direct detection cameras with applications in cryogenic electron microscopy (cryo-EM), but it's high flexibility allows usage with a variety of sensors. An operational transconductance amplifier (OTA) and a transimpedance amplifier (TIA) replace the traditional instrumentation amplifier, to allow power reduction and decoupling of the gain and bandwidth stages. This allows for a tunable gain in order to exploit the digitizer full-scale range, and an independent bandwidth tuning capability to accommodate a variety of sensors. Additionally, the front-end supports a very wide input common-mode range, and provides offset correction capability as well as frame marker operation. The chip is fabricated in a commercially available 180nm CMOS technology using dual 3.3V/1.8V supply. It achieves more than ±10% gain tunability at 0-1.2V sensor dark-level range, and up to 142MHz operation. Power consumption is measured at 37mW/channel with 155μV input-referred noise, at nominal conditions. The chip is a low-power, low-noise, highly optimized solution allowing area and power reduction in camera assemblies.
• article_number: 9059766
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9059766
• html_url: https://ieeexplore.ieee.org/document/9059766/
• abstract_url: https://ieeexplore.ieee.org/document/9059766/
• publication_title: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
• conference_location: Manchester, UK
• conference_dates: 26 Oct.-2 Nov. 2019
• publication_number: 9039702
• is_number: 9059608
• publication_year: 2019
• publication_date: 26 Oct.-2 Nov. 2019
• start_page: 1
• end_page: 2
• citing_paper_count: 0
• citing_patent_count: 0
• download_count: 160
• insert_date: 20200409
• index_terms:
  • ieee_terms:
    • Sensors
    • Tuning
    • Cameras
    • CMOS image sensors
    • Linearity
    • Resistors
  • author_terms:
    • line driver
    • single-ended-to-differential
    • image sensors
    • electron microscopy
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Settling Time
    • Colonial Times
    • Gain Tuning
    • Power Consumption
    • cryo-EM
    • Cryo-electron Microscopy
    • Reduction In Area
    • Reduction In Power
    • Variety Of Sensors
    • Diverse Sensors
    • Transimpedance Amplifier
    • Offset Correction
    • Direct Detection Camera
    • Input-referred Noise
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-4165-7, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-4164-0, isbnType: New-2005
• authors:
  • Author Name: Aikaterini Papadopoulou
    Affiliation: Lawrence Berkeley National Laboratory, Berkeley, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37086179530
    ID: 37086179530
    Order: 1
    Author Affiliations:
    • Lawrence Berkeley National Laboratory, Berkeley, CA, USA
  • Author Name: Carl Grace
    Affiliation: Lawrence Berkeley National Laboratory, Berkeley, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37442050400
    ID: 37442050400
    Order: 2
    Author Affiliations:
    • Lawrence Berkeley National Laboratory, Berkeley, CA, USA
  • Author Name: Peter Denes
    Affiliation: Lawrence Berkeley National Laboratory, Berkeley, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37327639900
    ID: 37327639900
    Order: 3
    Author Affiliations:
    • Lawrence Berkeley National Laboratory, Berkeley, CA, USA
  • Author Name: Armin Karcher
    Affiliation: Lawrence Berkeley National Laboratory, Berkeley, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37271717100
    ID: 37271717100
    Order: 4
    Author Affiliations:
    • Lawrence Berkeley National Laboratory, Berkeley, CA, USA

Image Sensor

• sensor_type: CMOS
• resolution: not specified
• dynamic_range: not specified
• pixel_size: not specified
• dark_current: not specified

Optical Data

• focal_length: not specified
• aperture: not specified
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• power_consumption: 37 mW/channel
• noise: 155 µV

Applications & Benefits

• cell_imaging: Used in single-electron counting direct detection cameras for cryogenic electron microscopy (Cryo-EM)
• benefits: Low power, low noise, independently tunable gain and settling time.

Supporting Organizations

• supported_by: Lawrence Berkeley National Laboratory, Berkeley, CA, USA

Manuscript Details

• publication_date: 26 Oct.-2 Nov. 2019

Relevancy Score

• score: 10
• missing_fields:
  • resolution
  • dynamic_range
  • pixel_size
  • dark_current
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • signal_to_noise_ratio
  • sensitivity
  • shutter_speed

Processed JSON Filename

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