A 3Mpixel Multiaperture Image Sensor With 07M Pixels In 011M Cmos

• doi: 10.1109/ISSCC.2008.4523050
• title: A 3MPixel Multi-Aperture Image Sensor with 0.7μm Pixels in 0.11μm CMOS
• publisher: IEEE
• isbn: 978-1-4244-2011-7
• issn: 2376-8606
• partnum: 08CH37986
• rank: 438
• access_type: LOCKED
• content_type: Conferences
• abstract: Conventional image sensors have improved with technology scaling mainly by reducing pixel size to increase spatial resolution [1,2]. As resolution approaches the limits of existing optics, is there much to gain from further pixel scaling? In [3], we argue that further scaling can provide new imaging capabilities via a multi-aperture (MA) architecture, which consists of an array of small submicron pixel imagers (apertures), each with its own integrated optics. By focusing the integrated optics onto an image plane formed by an objective lens in a region above the MA imager, the apertures capture overlapping views of the scene. The correlation and redundancy between apertures, along with computation, provide several new capabilities, including: (i) simultaneous capture of a 2D image at higher resolution than the aperture count and a 3D depth map without the need for active illumination or calibration; (ii) simplification of the objective lens design; (iii) reduction of color crosstalk via per-aperture color filters; and (iv) increased tolerance to pixel defects. It is further shown that depth resolution continues to improve with pixel scaling beyond the typical spot-size of the optics. Designing scalable arrays of submicron pixels with acceptable imaging performance is challenging however. In [3], we propose using a frame-transfer (FT) CCD aperture with CMOS readout architecture. In [4], we demonstrate a 16×16, 0.5μm pixel-pitch FT-CCD in 0.11μm CMOS technology with acceptable imaging performance.
• article_number: 4523050
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4523050
• html_url: https://ieeexplore.ieee.org/document/4523050/
• abstract_url: https://ieeexplore.ieee.org/document/4523050/
• publication_title: 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers
• conference_location: San Francisco, CA, USA
• conference_dates: 3-7 Feb. 2008
• publication_number: 4497158
• is_number: 4523032
• publication_year: 2008
• publication_date: 3-7 Feb. 2008
• start_page: 48
• end_page: 594
• citing_paper_count: 13
• citing_patent_count: 185
• download_count: 879
• insert_date: 20090109
• index_terms:
  • ieee_terms:
    • Image sensors
    • Pixel
    • CMOS image sensors
    • Voltage
    • Electrodes
    • Buffer storage
    • CMOS technology
    • Sensor arrays
    • Charge transfer
    • Apertures
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Μm CMOS
    • Electrode
    • Aperture
    • Decoding
    • Decryption
    • Objective Lens
    • Objective Lenses
    • Microscope Objective
    • Acceptable Performance
    • Imaging Capability
    • CMOS Technology
    • Photonic Integrated Circuits
    • Integrated Optics
    • Photonic Chip
    • Scalable Technology
    • Pixel Array
    • Small Pixel
    • Pixel Scale
    • Regeneration Buffer
    • Framebuffer
    • Display Memory
    • Lens Design
    • Design Of Lenses
    • Need For Calibration
    • Readout Circuit
    • Gray Code
    • Grey Number
    • Reset Voltage
• isbn_formats:
  • format: CD, value: 978-1-4244-2011-7, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-2010-0, isbnType: New-2005
• authors:
  • Author Name: Keith Fife
    Affiliation: University of Stanford, Stanford, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37281720800
    ID: 37281720800
    Order: 1
    Author Affiliations:
    • University of Stanford, Stanford, CA, USA
  • Author Name: Abbas El Gamal
    Affiliation: University of Stanford, Stanford, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37274961200
    ID: 37274961200
    Order: 2
    Author Affiliations:
    • University of Stanford, Stanford, CA, USA
  • Author Name: H.-S. Philip Wong
    Affiliation: University of Stanford, Stanford, CA, USA
    Author URL: https://ieeexplore.ieee.org/author/37292823100
    ID: 37292823100
    Order: 3
    Author Affiliations:
    • University of Stanford, Stanford, CA, USA

Image Sensor

• sensor_type: FT-CCD (Frame-Transfer Charge-Coupled Device) in CMOS technology
• resolution: 3MPixel (166 x 76 pixels of 16 x 16, 0.7 µm pixels)
• dynamic_range: 57 dB
• pixel_size: 0.7 µm
• dark_current: 33 e-/sec at room temperature

Optical Data

• focal_length: Not specified
• aperture: f/2.4
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 15 fps (maximum frame rate with CDS)
• signal_to_noise_ratio: 2 % rms
• sensitivity: 930 e-/lux-sec at 550 nm
• power_consumption: 10.45 mW
• noise: 20 e- rms (1 mV) pixel read noise

Applications & Benefits

• cell_imaging: Not specified
• benefits: Simultaneous capture of 2D high-resolution images and 3D depth maps without active illumination or calibration; improved objective lens design; reduction of color crosstalk; increased tolerance to pixel defects.

Supporting Organizations

• supported_by: TSMC

Manuscript Details

• publication_date: 3-7 Feb. 2008

Relevancy Score

• score: 10

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