A 33Megapixel 120Framespersecond 25Watt Cmos Image Sensor With Columnparallel Twostage Cyclic Analogtodigital Converters

• doi: 10.1109/TED.2012.2220364
• title: A 33-Megapixel 120-Frames-Per-Second 2.5-Watt CMOS Image Sensor With Column-Parallel Two-Stage Cyclic Analog-to-Digital Converters
• publisher: IEEE
• isbn:
• issn: 1557-9646
• rank: 424
• access_type: LOCKED
• content_type: Journals
• abstract: A 33-megapixel 120-frames/s (fps) CMOS image sensor has been developed. The 7808 × 4336 pixel 2.8-μm pixel pitch CMOS image sensor with 12-bit, column-parallel, two-stage, cyclic analog-to-digital converters (ADCs) and 96 parallel low-voltage differential signaling output ports operates at a data rate of 51.2 Gb/s. The pipelined operation of the two cyclic ADCs reduces the conversion time. This ADC architecture also effectively lowers the power consumption by exploiting the amplifier function of the cyclic ADC. The CMOS image sensor implemented with 0.18-μm technology exhibits a sensitivity of 0.76 V/lx·s without a microlens and a random noise of 5.1 erms- with no column amplifier gain and 3.0erms- with a gain of 7.5 at 120 fps while dissipating only 2.45 and 2.67 W, respectively.
• article_number: 6341066
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6341066
• html_url: https://ieeexplore.ieee.org/document/6341066/
• abstract_url: https://ieeexplore.ieee.org/document/6341066/
• publication_title: IEEE Transactions on Electron Devices
• conference_location:
• conference_dates:
• publication_number: 16
• is_number: 6353354
• publication_year: 2012
• publication_date: Dec. 2012
• start_page: 3426
• end_page: 3433
• citing_paper_count: 88
• citing_patent_count: 0
• download_count: 2143
• insert_date: 20121026
• index_terms:
  • ieee_terms:
    • Capacitors
    • CMOS image sensors
    • Noise measurement
    • Power demand
    • Image resolution
  • author_terms:
    • Analog–digital conversion
    • CMOS image sensors
    • high-definition video
    • high-resolution imaging
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Power Consumption
    • Random Noise
    • Channel Noise
    • Output Signal
    • Output Ports
    • Conversion Time
    • High-resolution
    • Time Constant
    • Scaling Factor
    • Total Power
    • Thermal Noise
    • Current Noise
    • Low Power Consumption
    • Settling Time
    • Colonial Times
    • Total Current
    • Sensor Characteristics
    • Sensor Features
    • Bias Current
    • Least Significant Bit
    • Low Bit
    • Most Significant Bit
    • High Bit
    • Highest Bit
    • Total Power Consumption
    • Pixel Array
    • Amplification Phase
    • Capacitor Size
    • Feedback Phase
    • 12-bit Resolution
    • Ultra-high-definition
    • Ultra HD
    • Total Noise
    • Input-referred Noise
• authors:
  • Author Name: Kazuya Kitamura
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38238243500
    ID: 38238243500
    Order: 1
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    • NHK Science and Technology Research Laboratories, Tokyo, Japan
  • Author Name: Toshihisa Watabe
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37283667400
    ID: 37283667400
    Order: 2
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    • NHK Science and Technology Research Laboratories, Tokyo, Japan
  • Author Name: Takehide Sawamoto
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38237035500
    ID: 38237035500
    Order: 3
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Tomohiko Kosugi
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38236166000
    ID: 38236166000
    Order: 4
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: Tomoyuki Akahori
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/38071525400
    ID: 38071525400
    Order: 5
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: Tetsuya Iida
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37328818100
    ID: 37328818100
    Order: 6
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: Keigo Isobe
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37409394900
    ID: 37409394900
    Order: 7
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: Takashi Watanabe
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37068458100
    ID: 37068458100
    Order: 8
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Hiroshi Shimamoto
    Affiliation: NHK Science and Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/38031226700
    ID: 38031226700
    Order: 9
    Author Affiliations:
    • NHK Science and Technology Research Laboratories, Tokyo, Japan
  • Author Name: Hiroshi Ohtake
    Affiliation: NHK Science and Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37331518200
    ID: 37331518200
    Order: 10
    Author Affiliations:
    • NHK Science and Technology Research Laboratories, Tokyo, Japan
  • Author Name: Satoshi Aoyama
    Affiliation: Brookman Technology, Inc., Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37408090900
    ID: 37408090900
    Order: 11
    Author Affiliations:
    • Brookman Technology, Inc., Hamamatsu, Japan
  • Author Name: Shoji Kawahito
    Affiliation: Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
    Author URL: https://ieeexplore.ieee.org/author/37300195700
    ID: 37300195700
    Order: 12
    Author Affiliations:
    • Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
  • Author Name: Norifumi Egami
    Affiliation: NHK Science and Technology Research Laboratories, Tokyo, Japan
    Author URL: https://ieeexplore.ieee.org/author/37283669900
    ID: 37283669900
    Order: 13
    Author Affiliations:
    • NHK Science and Technology Research Laboratories, Tokyo, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 7808x4336 (33 megapixels)
• dynamic_range: 12-bit
• pixel_size: 2.8 micrometres (μm)
• dark_current: not explicitly stated in the provided text (but it mentions random noise of 5.1 e- rms without column amplifier gain)

Optical Data

• focal_length: not provided
• aperture: not provided
• field_of_view: not provided
• distortion: not provided

Performance Metrics

• frame_rate: 120 fps
• signal_to_noise_ratio: not explicitly stated, but mentioned as 0.76 V/lx·s
• sensitivity: 0.76 V/lx·s
• shutter_speed: not provided
• power_consumption: 2.45 W at 120 fps, 2.67 W with analog gain of 7.5
• noise: 5.1 e- rms without gain, 3.0 e- rms with gain of 7.5

Applications & Benefits

• cell_imaging: suitable for ultrahigh-definition color imaging systems
• benefits: enhanced visual experience in Super Hi-Vision (SHV) television systems

Supporting Organizations

• supported_by: NHK Science & Technology Research Laboratories, Brookman Technology, Inc.

Manuscript Details

• publication_date: Dec. 2012

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion

Processed JSON Filename

request_09419347-e7c5-48b4-97df-ad7690ab327f-a_33megapixel_120framespersecond_25watt_cmos_image_sensor_with_columnparallel_twostage_cyclic_analogtodigital_converters.json