A 2Mpixel 14Inch Cmos Image Sensor With Enhanced Pixel Architecture For Camera Phones And Pc Cameras

• doi: 10.1109/ISSCC.2008.4523055
• title: A 2Mpixel 1/4-inch CMOS Image Sensor with Enhanced Pixel Architecture for Camera Phones and PC Cameras
• publisher: IEEE
• isbn: 978-1-4244-2011-7
• issn: 2376-8606
• partnum: 08CH37986
• rank: 387
• access_type: LOCKED
• content_type: Conferences
• abstract: This paper presents performance data for a second-generation, 2Mpixel, 1/4-inch CMOS image sensor with state-of-the-art pixel technology that targets camera phones, PC cameras, PDAs and other portable devices. Continuous improvements in pixel design have enabled smaller pixels to be used without compromising performance. This sensor incorporates the latest pixel technology and enables higher performance than previous generations with the same optical format. The sensor uses a fully symmetric common-element pixel architecture (CEPA) with 2.5 equivalent transistors per pixel along with internal control of a reset transistor to maximize quantum efficiency and enable additional process improvement. The die size is also significantly smaller than the previous generation, simplifying the design process and enabling smaller modules. The sensor is also compatible with standard mobile imaging architecture (SMIA) requirements, which simplifies camera module design.
• article_number: 4523055
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4523055
• html_url: https://ieeexplore.ieee.org/document/4523055/
• abstract_url: https://ieeexplore.ieee.org/document/4523055/
• publication_title: 2008 IEEE International Solid-State Circuits Conference - Digest of Technical Papers
• conference_location: San Francisco, CA, USA
• conference_dates: 3-7 Feb. 2008
• publication_number: 4497158
• is_number: 4523032
• publication_year: 2008
• publication_date: 3-7 Feb. 2008
• start_page: 58
• end_page: 59
• citing_paper_count: 1
• citing_patent_count: 0
• download_count: 583
• insert_date: 20090109
• index_terms:
  • ieee_terms:
    • CMOS image sensors
    • Cameras
    • Pixel
    • CMOS technology
    • Optical sensors
    • Personal digital assistants
    • Continuous improvement
    • Process design
    • Image sensors
    • Optical imaging
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Smartphone Camera
    • Phone Camera
    • Mobile Devices
    • Portable Devices
    • Circuitry
    • Quantum Efficiency
    • Previous Generations
    • Improvements In Design
    • Improvement In Identification
    • Current Sensor
    • Light Sensitivity
    • Photophobic
    • Potential Well
    • Principal Plane
    • Center Of The Lens
    • Optical Center
    • Square Pixels
    • Ratio Of Pixels
    • Digital Circuits
    • Digital Circuitry
    • Pixel Array
    • Microlenses
    • Micro Lens
    • Central Direction
    • Reset Gate
    • Output Pixel
    • Separation Buffer
    • Grounding Line
• isbn_formats:
  • format: CD, value: 978-1-4244-2011-7, isbnType: New-2005
  • format: Print ISBN, value: 978-1-4244-2010-0, isbnType: New-2005
• authors:
  • Author Name: Jorgen Moholt
    Affiliation: Micron Technology, Inc., Oslo, Norway
    Author URL: https://ieeexplore.ieee.org/author/37564617800
    ID: 37564617800
    Order: 1
    Author Affiliations:
    • Micron Technology, Inc., Oslo, Norway
  • Author Name: Trygve Willassen
    Affiliation: Micron Technology, Inc., Oslo, Norway
    Author URL: https://ieeexplore.ieee.org/author/38072588000
    ID: 38072588000
    Order: 2
    Author Affiliations:
    • Micron Technology, Inc., Oslo, Norway
  • Author Name: John Ladd
    Affiliation: Micron Technology, Inc., Boise, ID, USA
    Author URL: https://ieeexplore.ieee.org/author/37683774500
    ID: 37683774500
    Order: 3
    Author Affiliations:
    • Micron Technology, Inc., Boise, ID, USA
  • Author Name: Xiaofeng Fan
    Affiliation: Micron Technology, Inc., Boise, ID, USA
    Author URL: https://ieeexplore.ieee.org/author/37692193300
    ID: 37692193300
    Order: 4
    Author Affiliations:
    • Micron Technology, Inc., Boise, ID, USA
  • Author Name: Dean Gans
    Affiliation: Micron Technology, Inc., Boise, ID, USA
    Author URL: https://ieeexplore.ieee.org/author/38094119800
    ID: 38094119800
    Order: 5
    Author Affiliations:
    • Micron Technology, Inc., Boise, ID, USA

Image Sensor

• sensor_type: CMOS
• resolution: 2Mpixel
• dynamic_range: 72.6 dB
• pixel_size: not specified
• dark_current: < 0.5 e-/s

Optical Data

• focal_length: not specified
• aperture: f/2.8
• field_of_view: not specified
• distortion: not specified

Performance Metrics

• frame_rate: 30fps
• signal_to_noise_ratio: 72.6 dB
• power_consumption: 200 mW
• noise: 39.5 e-

Applications & Benefits

• cell_imaging: targeted towards camera phones, PC cameras, PDAs, and other portable devices
• benefits: smaller die size simplifies design; enhanced sensitivity and increased performance

Supporting Organizations

• supported_by: Micron Technology, Inc.

Manuscript Details

• publication_date: 3-7 Feb. 2008

Relevancy Score

• score: 10
• missing_fields:
  • pixel_size
  • focal_length
  • field_of_view
  • distortion
  • sensitivity
  • shutter_speed
  • quantum_efficiency

Processed JSON Filename

request_2e366113-20ce-46ae-9d34-46d4f7a97f8e-a_2mpixel_14inch_cmos_image_sensor_with_enhanced_pixel_architecture_for_camera_phones_and_pc_cameras.json