A 240Fps Incolumn Binarized Neural Network Processing In Cmos Image
Sensors
- doi: 10.1109/TCSII.2023.3295391
-
title: A 240-FPS In-Column Binarized Neural Network
Processing in CMOS Image Sensors
- publisher: IEEE
- isbn:
- issn: 1558-3791
- rank: 369
- access_type: LOCKED
- content_type: Journals
-
abstract: This brief presents a CMOS image sensor (CIS)
integrated with a binarized neural network (BNN) for face detection in
always-on image classification applications. We propose a process
variation-immune comparator-based row buffer generating edge images that
are inputs of the BNN processor. To reduce the power consumption of
column-parallel row buffers, we adopted comparator-based switched
capacitor (CBSC) circuits. With a proposed auto-zeroed current source
block circuit that operates with low supply voltages, we observed a low
variation of row buffers’ outputs. The measurement results showed that
the $\sigma /\mu $ of the row buffers’ output is decreased by 4% while
reducing 28% of power consumption compared to conventional CBSC-based
row buffers. The proposed CIS with an in-column BNN processor having a
single channel and two hidden layers was fabricated in a 1-poly 4-metal
110nm CIS process. As a measurement result, we achieved an image
classification accuracy is 97.75%. Furthermore, the image resolution is
$120\times 120$ , and the total power consumption of the proposed CIS is
3.78 mW with supply voltages of 2.8 V and 1.5 V at 240 frames per
second.
- article_number: 10184128
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10184128
-
html_url:
https://ieeexplore.ieee.org/document/10184128/
-
abstract_url:
https://ieeexplore.ieee.org/document/10184128/
-
publication_title: IEEE Transactions on Circuits and
Systems II: Express Briefs
- conference_location:
- conference_dates:
- publication_number: 8920
- is_number: 10262390
- publication_year: 2023
- publication_date: Oct. 2023
- start_page: 3907
- end_page: 3911
- citing_paper_count: 0
- citing_patent_count: 0
- download_count: 642
- insert_date: 20230714
-
index_terms:
-
ieee_terms:
- Image edge detection
- Power demand
- Convolution
- Charge transfer
- Switching circuits
- Neural networks
- Voltage control
-
author_terms:
- Always-on
- binarized neural network
- CMOS image sensor
- edge mask
- row buffer
- face detection
-
dynamic_index_terms:
- Neural Network
- Binary Neural Networks
- Power Consumption
- Image Classification
- Current Source
- Current Regulations
- Single Channel
- Supply Voltage
- Image Edge
- Face Detection
- Total Power Consumption
- Capacitor Circuit
- Switched Capacitor
- Low Supply Voltage
- Convolutional Neural Network
- Convolutional Layers
- Feature Maps
- Sampling Error
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Analog Voltage
- Rolling Shutter
- High Frame Rate
- Offset Voltage
- Additional Voltage
-
authors:
-
Author Name: Bohyeok Jeong
Affiliation: Department of Semiconductor Science,
Dongguk University (Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37089883549
ID: 37089883549
Order: 1
Author Affiliations:
-
Department of Semiconductor Science, Dongguk University (Seoul
Campus), Seoul, South Korea
-
Author Name: Jaehwan Lee
Affiliation: Department of Industrial and Systems
Engineering and the Data Science Laboratory, Dongguk University
(Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37089884079
ID: 37089884079
Order: 2
Author Affiliations:
-
Department of Industrial and Systems Engineering and the Data
Science Laboratory, Dongguk University (Seoul Campus), Seoul,
South Korea
-
Author Name: Suhyeon Lee
Affiliation: Department of Semiconductor Science,
Dongguk University (Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37090012117
ID: 37090012117
Order: 3
Author Affiliations:
-
Department of Semiconductor Science, Dongguk University (Seoul
Campus), Seoul, South Korea
-
Author Name: Soyeon Lee
Affiliation: Department of Semiconductor Science,
Dongguk University (Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37090012111
ID: 37090012111
Order: 4
Author Affiliations:
-
Department of Semiconductor Science, Dongguk University (Seoul
Campus), Seoul, South Korea
-
Author Name: Youngdoo Son
Affiliation: Department of Industrial and Systems
Engineering and the Data Science Laboratory, Dongguk University
(Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37088701320
ID: 37088701320
Order: 5
Author Affiliations:
-
Department of Industrial and Systems Engineering and the Data
Science Laboratory, Dongguk University (Seoul Campus), Seoul,
South Korea
-
Author Name: Soo Youn Kim
Affiliation: Department of Semiconductor Science,
Dongguk University (Seoul Campus), Seoul, South Korea
Author URL:
https://ieeexplore.ieee.org/author/37859344600
ID: 37859344600
Order: 6
Author Affiliations:
-
Department of Semiconductor Science, Dongguk University (Seoul
Campus), Seoul, South Korea
Image Sensor
- sensor_type: CMOS
- resolution: 120x120
- dynamic_range: not specified
- pixel_size: not specified
- dark_current: not specified
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
- frame_rate: 240 fps
- power_consumption: 3.78 mW
Applications & Benefits
-
cell_imaging: Face detection in always-on applications
-
benefits: Low power consumption and high frame rate
with accurate face detection.
Supporting Organizations
-
supported_by: National Research Foundation of Korea
(NRF)
Manuscript Details
- publication_date: Oct. 2023
Relevancy Score
- score: 9
-
missing_fields:
- dynamic_range
- pixel_size
- dark_current
- focal_length
- aperture
- field_of_view
- distortion
- signal_to_noise_ratio
- sensitivity
- shutter_speed
- noise
Processed JSON Filename
request_2fdeb3b7-3624-46a2-a734-5caab1232955-a_240fps_incolumn_binarized_neural_network_processing_in_cmos_image_sensors.json