A 1 Kspl Times1 K High Dynamic Range Cmos Image Sensor With Onchip Programmable Regionofinterest Readout

• doi: 10.1109/JSSC.2002.1015690
• title: A 1 K/spl times/1 K high dynamic range CMOS image sensor with on-chip programmable region-of-interest readout
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 187
• access_type: LOCKED
• content_type: Journals
• abstract: An integrated 1024/spl times/1024 CMOS image sensor with programmable region-of-interest (ROI) readout and multiexposure technique has been developed and successfully tested. Size and position of the ROI is programmed based on multiples of a minimum readout kernel of 32/spl times/32 pixels. Since the dynamic range of the irradiance normally exceeds the electrical dynamic range of the imager that can be covered using a single integration time, a multiexposure technique has been implemented in the imager. Subsequent sensor images are acquired using different integration times and recomputed to form a single composite image. A newly developed algorithm performing the recomputation is presented. The chip has been realized in a 0.5-/spl mu/m n-well standard CMOS process. The pixel pitch is 10 /spl mu/m/sup 2/ and the total chip area is 164 mm/sup 2/.
• article_number: 1015690
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=1015690
• html_url: https://ieeexplore.ieee.org/document/1015690/
• abstract_url: https://ieeexplore.ieee.org/document/1015690/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 21860
• publication_year: 2002
• publication_date: July 2002
• start_page: 911
• end_page: 915
• citing_paper_count: 26
• citing_patent_count: 6
• download_count: 730
• insert_date: 20020807
• index_terms:
  • ieee_terms:
    • Dynamic range
    • CMOS image sensors
    • Layout
    • Photodiodes
    • Lighting
    • Microelectronics
    • Circuits and systems
    • Image sensors
    • CMOS technology
    • Smart pixels
  • dynamic_index_terms:
    • Dynamic Range
    • Image Sensor
    • Camera Sensor
    • Dynamic Imaging
    • High Dynamic Range
    • Integration Time
    • Composite Image
    • Chip Area
    • Regions Of Interest Location
    • Region Of Interest Position
    • Exposure Time
    • Frame Rate
    • Incident Radiation
    • Incident Irradiance
    • Linear Features
    • Linear Characteristics
    • Digital Circuits
    • Digital Circuitry
    • Transfer Curves
    • Optical Range
    • Shift Register
    • Skip Patterns
    • High Dynamic Range Image
• authors:
  • Author Name: O. Schrey
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37274375000
    ID: 37274375000
    Order: 1
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
  • Author Name: J. Huppertz
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and Systems, Toshiba Electronics Europe, D-40549 Düsseldorf, Germany, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37331483800
    ID: 37331483800
    Order: 2
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and Systems, Toshiba Electronics Europe, D-40549 Düsseldorf, Germany, Duisburg, Germany
  • Author Name: G. Filimonovic
    Affiliation: Thales Electronic Engineering, Dusseldorf, Germany
    Author URL: https://ieeexplore.ieee.org/author/37330763700
    ID: 37330763700
    Order: 3
    Author Affiliations:
    • Thales Electronic Engineering, Dusseldorf, Germany
    • Thales Electronic Engineering, Düsseldorf, Germany, Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
  • Author Name: A. Bussmann
    Affiliation:
    Author URL: https://ieeexplore.ieee.org/author/37426555700
    ID: 37426555700
    Order: 4
    
  • Author Name: W. Brockherde
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37275079200
    ID: 37275079200
    Order: 5
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
  • Author Name: B.J. Hosticka
    Affiliation: Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany
    Author URL: https://ieeexplore.ieee.org/author/37275079700
    ID: 37275079700
    Order: 6
    Author Affiliations:
    • Fraunhofer Institute of Microelectronic Circuits and Systems, Duisburg, Germany

Image Sensor

• sensor_type: CMOS
• resolution: 1024x1024
• dynamic_range: 92 dB
• pixel_size: 10 µm
• dark_current: Not specified

Optical Data

• focal_length: Not specified
• aperture: Not specified
• field_of_view: Not specified
• distortion: Not specified

Performance Metrics

• frame_rate: 870 fps (ROI mode)
• shutter_speed: 1 µs (for ROI mode)

Applications & Benefits

• cell_imaging: Used for smart imaging in various applications.
• benefits: High dynamic range, programmable region-of-interest readout, and reduced chip area for digital control circuitry.

Supporting Organizations

• supported_by: Fraunhofer Institute of Microelectronic Circuits and Systems

Manuscript Details

• publication_date: July 2002

Relevancy Score

• score: 10
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • signal_to_noise_ratio
  • sensitivity
  • power_consumption
  • noise

Processed JSON Filename

request_f3fa09a2-fa2f-4005-bc8c-9d2bf046650f-a_1_kspl_times1_k_high_dynamic_range_cmos_image_sensor_with_onchip_programmable_regionofinterest_readout.json