A 12Bit Columnparallel Twostep Singleslope Adc With A Foreground Calibration For Cmos Image Sensors

• doi: 10.1109/ACCESS.2020.3025153
• title: A 12-Bit Column-Parallel Two-Step Single-Slope ADC With a Foreground Calibration for CMOS Image Sensors
• publisher: IEEE
• isbn:
• issn: 2169-3536
• rank: 272
• access_type: CCBY - IEEE is not the copyright holder of this material. Please follow the instructions via https://creativecommons.org/licenses/by/4.0/ to obtain full-text articles and stipulations in the API documentation.
• content_type: Journals
• abstract: This paper proposes a novel 12-bit column-parallel two-step single-slope (SS) analog-to-digital converter (ADC) for high-speed CMOS image sensors. Cooperating with the output offset storage (OOS) technique, a new correlated double sampling (CDS) is adopted to reduce the non-uniformity in column-level ADCs. In the proposed structure, the decision point of the comparator is independent of the input signal. The variation of the comparator offset caused by the input level is eliminated. Through a foreground calibration, the non-idealities from the ramp generator and the column ADC are both corrected. Design and simulation in a 130nm CMOS process, the proposed ADC achieves the differential nonlinearity (DNL) of +0.76/-0.8 LSB and the integral nonlinearity (INL) of +1.06/-0.84 LSB at a sampling frequency of 100 KS/s with the calibration. The effective number of bits (ENOB) is also improved from 4.66 bits to 11.25 bits. The single ADC occupies an active area of 7.5 × 775 μm2 and the power consumption is 72 μW .
• article_number: 9201088
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9201088
• html_url: https://ieeexplore.ieee.org/document/9201088/
• abstract_url: https://ieeexplore.ieee.org/document/9201088/
• publication_title: IEEE Access
• conference_location:
• conference_dates:
• publication_number: 6287639
• is_number: 8948470
• publication_year: 2020
• publication_date: 2020
• start_page: 172467
• end_page: 172480
• citing_paper_count: 14
• citing_patent_count: 0
• download_count: 3527
• insert_date: 20200921
• index_terms:
  • ieee_terms:
    • Capacitors
    • Analog-digital conversion
    • Switches
    • Generators
    • Calibration
    • Linearity
    • Random access memory
  • author_terms:
    • Column-parallel ADC
    • single-slope (SS) ADC
    • two-step ADC
    • foreground calibration
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Foreground Calibration
    • Single-slope Analog-to-digital Converter
    • Single Slope Analog-to-digital Converters
    • Power Consumption
    • Input Signal
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • CMOS Process
    • Fast Fourier Transform
    • Inverse Fast Fourier Transform
    • Conversion Process
    • Quantization Error
    • Amount Of Error
    • Parasitic Capacitance
    • Final Coding
    • Charge Storage
    • Charge Injection
    • Clock Frequency
    • Input Pair
    • Voltage Ramp
    • Silicon Area
    • Final Calibration
    • Equivalent Voltage
    • Voltage Gap
    • Counter Value
    • Offset Error
    • Common-mode Voltage
• authors:
  • Author Name: Qihui Zhang
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/37086514261
    ID: 37086514261
    Order: 1
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
  • Author Name: Ning Ning
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/37408472900
    ID: 37408472900
    Order: 2
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
  • Author Name: Jing Li
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/38008055800
    ID: 38008055800
    Order: 3
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
  • Author Name: Qi Yu
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/37421561500
    ID: 37421561500
    Order: 4
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
  • Author Name: Kejun Wu
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/37085883560
    ID: 37085883560
    Order: 5
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
  • Author Name: Zhong Zhang
    Affiliation: State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China
    Author URL: https://ieeexplore.ieee.org/author/37086514501
    ID: 37086514501
    Order: 6
    Author Affiliations:
    • State Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, China

Image Sensor

• sensor_type: CMOS Image Sensor
• resolution: 12-bit
• dynamic_range: Unknown
• pixel_size: Unknown
• dark_current: Unknown

Optical Data

• focal_length: Unknown
• aperture: Unknown
• field_of_view: Unknown
• distortion: Unknown

Performance Metrics

• frame_rate: 100 frames/s
• signal_to_noise_ratio: 69.49 dB
• sensitivity: Unknown
• shutter_speed: Unknown
• power_consumption: 72 µW
• noise: 49 µVrms (preAmp1), 36 µVrms (preAmp2)

Applications & Benefits

• cell_imaging: Applicable in medical devices for imaging purposes.
• benefits: High-resolution, low-power consumption, and fast readout speed.

Supporting Organizations

• supported_by: National Natural Science Foundation of China

Manuscript Details

• publication_date: 2020

Relevancy Score

• score: 10
• missing_fields:
  • fill factor
  • quantum efficiency
  • temporal noise
  • fixed-pattern noise
  • microlenses
  • on-chip colour filters
  • global or rolling shutters
  • backside illumination

Processed JSON Filename

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