A 12 Bit 47Mss 2605W Digital Feedforward Incrementalsar Adc In 013M Cmos
For Image Sensors
- doi: 10.1109/JSEN.2021.3102082
-
title: A 12 Bit 4.7-MS/s 260.5-μW Digital Feed-Forward
Incremental-ΣΔ-SAR ADC in 0.13-μm CMOS for Image Sensors
- publisher: IEEE
- isbn:
- issn: 2379-9153
- rank: 269
- access_type: LOCKED
- content_type: Journals
-
abstract: This paper presents a 12 bit, 4.7 MS/s
Digital Feed-Forward Incremental $\Sigma \!\Delta $ - Successive
Approximation Register (DFF I- $\Sigma \!\Delta $ -SAR)
Analog-to-Digital Converter (ADC) for column readout of image sensors.
An input range detection phase and a new switching scheme for the DAC in
the first stage allow reaching the desired 4 bit resolution of the I-
$\Sigma \!\Delta $ stage with an Over Sampling Ratio (OSR) of 8. A
second stage SAR converts the I- $\Sigma \!\Delta $ residue voltage
resolving the 8 Least Significant Bits (LSBs). The ADC is integrated in
a test chip with a Source Follower (SF) test unit that emulates a pixel
array and is fabricated using 2-Poly-4-Metal 130 nm CMOS technology. The
ADC operates under 3.3 V/1.2 V supply voltages, achieving a DNL of
−0.43/0.62 12 bit LSBs, $356~\mu \text{V}$ rms noise, equivalent to 9.2
bit ENOB at a sampling frequency of 4.7 MS/s with an OSR of 8. The
proposed ADC consumes $260.5~\mu \text{W}$ of power, yielding a Walden
Figure-of-Merit 94 fJ/c.s.. The core area is $18400~\mu \text{m}^{2}$ .
- article_number: 9504573
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9504573
-
html_url:
https://ieeexplore.ieee.org/document/9504573/
-
abstract_url:
https://ieeexplore.ieee.org/document/9504573/
- publication_title: IEEE Sensors Journal
- conference_location:
- conference_dates:
- publication_number: 7361
- is_number: 9555929
- publication_year: 2021
- publication_date: 1 Oct.1, 2021
- start_page: 21653
- end_page: 21666
- citing_paper_count: 4
- citing_patent_count: 0
- download_count: 1614
- insert_date: 20210803
-
index_terms:
-
ieee_terms:
- Image sensors
- Layout
- Sensors
- Image resolution
- Capacitors
- Pipelines
- Analog-digital conversion
-
author_terms:
- Analog to digital converter (ADC)
- CMOS image sensor (CIS)
- CMOS image sensor readout
- incremental ΣΔ ADC
- successive approximation register (SAR) ADC
- ultra-high-definition-tele-vision (UHTV)
- virtual-reality (VR)
- 16k resolution
-
dynamic_index_terms:
- Image Sensor
- Camera Sensor
- Analog-to-digital Converter
- Analog-to-digital
- Digital-to-analog Converter
- Supply Voltage
- Input Range
- Least Significant Bit
- Low Bit
- Test Chip
- Quantum
- Power Consumption
- Input Signal
- Common Mode
- Power Efficiency
- Thermal Noise
- Current Noise
- Output Range
- Yield Range
- Head-mounted Display
- Most Significant Bit
- High Bit
- Highest Bit
- Inductive Load
- Load Capacitance
- Operational Amplifier
- Op-amp
- Total Capacitance
- Clock Cycles
- Quantization Noise
- Integrator Output
- Ultra-high-definition
- Ultra High Definition
- Ultra HD
- Capacitor Size
- Offset Voltage
- Camera Module
- Voltage Swing
- Output Code
- Capacity Of Samples
- Simulation System
- Negative Input
-
authors:
-
Author Name: Fortunato Frazzica
Affiliation: STMicroelectronics, Catania, Italy
Author URL:
https://ieeexplore.ieee.org/author/37087068517
ID: 37087068517
Order: 1
Author Affiliations:
- STMicroelectronics, Catania, Italy
- ETRO, Vrije Universiteit Brussel, Ixelles, Belgium
-
Author Name: Toshio Yasue
Affiliation: NHK Science and Technology Research
Laboratories, Tokyo, Japan
Author URL:
https://ieeexplore.ieee.org/author/37085645432
ID: 37085645432
Order: 2
Author Affiliations:
-
NHK Science and Technology Research Laboratories, Tokyo, Japan
-
Author Name: Annachiara Spagnolo
Affiliation: imec, Leuven, Belgium
Author URL:
https://ieeexplore.ieee.org/author/37706287100
ID: 37706287100
Order: 3
Author Affiliations:
-
Author Name: David San Segundo Bello
Affiliation: Pyxalis, Moirans, France
Author URL:
https://ieeexplore.ieee.org/author/38259637200
ID: 38259637200
Order: 4
Author Affiliations:
-
Author Name: Maarten De Bock
Affiliation: Spectricity, Mechelen, Belgium
Author URL:
https://ieeexplore.ieee.org/author/37411548200
ID: 37411548200
Order: 5
Author Affiliations:
- Spectricity, Mechelen, Belgium
-
Author Name: Jan Craninckx
Affiliation: imec, Leuven, Belgium
Author URL:
https://ieeexplore.ieee.org/author/37268745200
ID: 37268745200
Order: 6
Author Affiliations:
-
Author Name: Piet Wambacq
Affiliation: ETRO, Vrije Universiteit Brussel,
Ixelles, Belgium
Author URL:
https://ieeexplore.ieee.org/author/37274342300
ID: 37274342300
Order: 7
Author Affiliations:
- ETRO, Vrije Universiteit Brussel, Ixelles, Belgium
- imec, Leuven, Belgium
Image Sensor
- sensor_type: CMOS
- resolution: 16k (15360 x 8640)
- dynamic_range: not specified
- pixel_size: 2.5 µm
- dark_current: not specified
Optical Data
- focal_length: not specified
- aperture: not specified
- field_of_view: not specified
- distortion: not specified
Performance Metrics
- frame_rate: 480 fps
- signal_to_noise_ratio: 57.1 dB
- power_consumption: 260.5 µW
- noise: 356 µV rms
Applications & Benefits
- cell_imaging: not specified
-
benefits: High-speed readout for advanced imaging
applications including UHDTV and VR.
Supporting Organizations
-
supported_by: Nippon Hoso Kyokai (NHK), Japan; imec,
Belgium
Manuscript Details
- publication_date: 1 Oct.1, 2021
Relevancy Score
- score: 9
-
missing_fields:
- fill factor
- quantum efficiency
- readout speed
- noise sources
- temporal noise
- fixed-pattern noise
- design considerations
- microlenses
- on-chip colour filters
- global or rolling shutters
- backside illumination
Processed JSON Filename
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