A 08 M Smart Dual Conversion Gain Pixel For 64 Megapixels Cmos Image Sensor With 12K E Fullwell Capacitance And Low Dark Noise

• doi: 10.1109/IEDM19573.2019.8993487
• title: A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels CMOS Image Sensor with 12k e- Full-Well Capacitance and Low Dark Noise
• publisher: IEEE
• isbn: 978-1-7281-4033-9
• issn: 0163-1918
• rank: 179
• access_type: LOCKED
• content_type: Conferences
• abstract: A 0.8 μm-pitch 64 megapixels ultrahighresolution CMOS image sensor has been demonstrated for mobile applications for the first time. Full-well capacity (FWC) of 6k e- was achieved in 0.8 μm pixels as the best in the world, and the advanced color filter (CF) isolation technology was introduced to overcome sensitivity degradation. Dual conversion gain (CG) technology was also first applied to mobile applications to improve the FWC performance of Tetracell up to 12k e-. In addition, highly refined deep trench isolation (DTI) and photodiode design significantly improved dark noise characteristics.
• article_number: 8993487
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8993487
• html_url: https://ieeexplore.ieee.org/document/8993487/
• abstract_url: https://ieeexplore.ieee.org/document/8993487/
• publication_title: 2019 IEEE International Electron Devices Meeting (IEDM)
• conference_location: San Francisco, CA, USA
• conference_dates: 7-11 Dec. 2019
• publication_number: 8971803
• is_number: 8993428
• publication_year: 2019
• publication_date: 7-11 Dec. 2019
• start_page: 16.2.1
• end_page: 16.2.4
• citing_paper_count: 18
• citing_patent_count: 0
• download_count: 3000
• insert_date: 20200213
• index_terms:
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Dark Noise
    • Low Dark Noise
    • Low Dark-noise
    • Megapixel sCMOS
    • Megapixels CMOS
    • Dual Conversion Gain
    • Mobile App
    • Mobile Application
    • Smartphone Application
    • Smartphone App
    • Mobile Apps
    • Smartphone Apps
    • Photodiode
    • Μm Pixel
    • Color Filter
    • Colour Filter
    • Crosstalk
    • Dynamic Range
    • Total Reflection
    • Total Internal Reflection
    • Dark Conditions
    • Electrical Characteristics
    • Previous Generations
    • Illumination Conditions
    • Half Of Value
    • White Spots
    • Dark Current
    • Optical Loss
    • Pixel Pitch
    • Temporal Noise
    • Reset Gate
    • Advanced Mode
• isbn_formats:
  • format: Print on Demand(PoD) ISBN, value: 978-1-7281-4033-9, isbnType: New-2005
  • format: Electronic ISBN, value: 978-1-7281-4032-2, isbnType: New-2005
• authors:
  • Author Name: Donghyuk Park
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37085741944
    ID: 37085741944
    Order: 1
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Seung-Wook Lee
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37089612053
    ID: 37089612053
    Order: 2
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Jinhwa Han
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37732831400
    ID: 37732831400
    Order: 3
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Dongyoung Jang
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37087266398
    ID: 37087266398
    Order: 4
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Heesang Kwon
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088727045
    ID: 37088727045
    Order: 5
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Seungwon Cha
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088696250
    ID: 37088696250
    Order: 6
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Mihye Kim
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37734231400
    ID: 37734231400
    Order: 7
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Haewon Lee
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38089642100
    ID: 38089642100
    Order: 8
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Sungho Suh
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088730388
    ID: 37088730388
    Order: 9
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Woong Joo
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088741251
    ID: 37088741251
    Order: 10
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Yunki Lee
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38190512200
    ID: 38190512200
    Order: 11
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Seungjoo Nah
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37087266617
    ID: 37087266617
    Order: 12
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Heegeun Jeong
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37290388200
    ID: 37290388200
    Order: 13
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Bumsuk Kim
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37067977300
    ID: 37067977300
    Order: 14
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Sangil Jung
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088730810
    ID: 37088730810
    Order: 15
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Jesuk Lee
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088733976
    ID: 37088733976
    Order: 16
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Yitae Kim
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/38067453800
    ID: 38067453800
    Order: 17
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Chang-Rok Moon
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37287589400
    ID: 37287589400
    Order: 18
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
  • Author Name: Yongin Park
    Affiliation: Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea
    Author URL: https://ieeexplore.ieee.org/author/37088737955
    ID: 37088737955
    Order: 19
    Author Affiliations:
    • Samsung Electronics Co., Ltd., Yongin-city, Gyeonggi-do, Korea

Image Sensor

• sensor_type: CMOS
• resolution: 64 Megapixels
• dynamic_range: Enhanced by 2.2 dB
• pixel_size: 0.8 µm
• dark_current: 1.5 e-/s

Optical Data

• focal_length: Not provided
• aperture: Not provided
• field_of_view: Not provided
• distortion: Not provided

Performance Metrics

• frame_rate: Not provided
• signal_to_noise_ratio: SNR enhanced by 2.2 dB
• sensitivity: Improved by 15%
• shutter_speed: Not provided
• power_consumption: Not provided
• noise: Temporal noise improved to 1.2 e-

Applications & Benefits

• cell_imaging: Not provided
• benefits: Higher resolution suitable for smartphone applications.

Supporting Organizations

• supported_by: Samsung Electronics Co., Ltd.

Manuscript Details

• publication_date: 7-11 Dec. 2019

Relevancy Score

• score: 9
• missing_fields:
  • focal_length
  • aperture
  • field_of_view
  • distortion
  • frame_rate
  • shutter_speed
  • power_consumption
  • cell_imaging

Processed JSON Filename

request_0ea9814f-318b-43b6-a2b7-435416c47536-a_08_m_smart_dual_conversion_gain_pixel_for_64_megapixels_cmos_image_sensor_with_12k_e_fullwell_capacitance_and_low_dark_noise.json