83 Mpixel 480Fps Globalshutter Cmos Image Sensor With Gainadaptive Column Adcs And Chiponchip Stacked Integration

• doi: 10.1109/JSSC.2016.2639741
• title: 8.3 M-Pixel 480-fps Global-Shutter CMOS Image Sensor with Gain-Adaptive Column ADCs and Chip-on-Chip Stacked Integration
• publisher: IEEE
• isbn:
• issn: 1558-173X
• rank: 130
• access_type: LOCKED
• content_type: Journals
• abstract: This paper presents a 4K2K 480-fps global-shutter CMOS image sensor with a super 35-mm format for a highly realistic digital video system. The sensor employs newly developed gain-adaptive column analog-to-digital converters to obtain input-referred dark random noise of 140 μVrms for an inputreferred full-scale readout of 923 mV. An on-chip online correction of the error between two switchable gains maintained the nonlinearity of the output image within 0.18%. A chip-onchip integration process realized a front-illuminated image sensor stacked with two diced logic chips through 38-K microbump interconnections. The global-shutter pixel achieved a parasitic light sensitivity of -99.6 dB. The 16-channel output interfaces with 4.752 Gbps/ch were implemented in the stacked logic chips.
• article_number: 7811267
• pdf_url: https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7811267
• html_url: https://ieeexplore.ieee.org/document/7811267/
• abstract_url: https://ieeexplore.ieee.org/document/7811267/
• publication_title: IEEE Journal of Solid-State Circuits
• conference_location:
• conference_dates:
• publication_number: 4
• is_number: 7888613
• publication_year: 2017
• publication_date: April 2017
• start_page: 985
• end_page: 993
• citing_paper_count: 37
• citing_patent_count: 0
• download_count: 4016
• insert_date: 20170109
• index_terms:
  • ieee_terms:
    • Gain
    • Analog-digital conversion
    • CMOS image sensors
    • Radiation detectors
    • Switches
    • Integrated circuit interconnections
  • author_terms:
    • Analog-to-digital converter (ADC)
    • chip-on-chip stacked device
    • CMOS image sensor
    • global shutter
    • high frame rate
    • low noise
  • dynamic_index_terms:
    • Image Sensor
    • Camera Sensor
    • Random Noise
    • Channel Noise
    • Analog-to-digital Converter
    • Analog-to-digital
    • Digital-to-analog Converter
    • Flip-chip
    • Microbumps
    • Input-referred Noise
    • Signal-to-noise
    • Signal-to-noise Ratio
    • Dynamic Range
    • Power Consumption
    • Photodiode
    • Low Noise
    • Device Structure
    • Automatic Gain Control
    • Conversion Time
    • Least Significant Bit
    • Low Bit
    • High Frame Rate
    • Digital Circuits
    • Digital Circuitry
    • Pixel Array
    • Digital Code
    • Circuit Configuration
    • Pixel Pitch
    • Output Pixel
    • Preset Level
    • Storage Nodes
    • Memory Regions
    • Output Scale
    • Threshold Voltage
    • Threshold Level
    • Stacking Structure
    • Digital Images
• authors:
  • Author Name: Yusuke Oike
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37267320700
    ID: 37267320700
    Order: 1
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Kentaro Akiyama
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085828753
    ID: 37085828753
    Order: 2
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Luong D. Hung
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088734195
    ID: 37088734195
    Order: 3
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Wataru Niitsuma
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088735329
    ID: 37088735329
    Order: 4
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Akihiko Kato
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38041293100
    ID: 38041293100
    Order: 5
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Mamoru Sato
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37334151600
    ID: 37334151600
    Order: 6
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yuri Kato
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38237448700
    ID: 38237448700
    Order: 7
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Wataru Nakamura
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37088744499
    ID: 37088744499
    Order: 8
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Hiroshi Shiroshita
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38075457900
    ID: 38075457900
    Order: 9
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yorito Sakano
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085828514
    ID: 37085828514
    Order: 10
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Yoshiaki Kitano
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085829248
    ID: 37085829248
    Order: 11
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Takuya Nakamura
    Affiliation: Sony Semiconductor Manufacturing, Kumamoto, Japan
    Author URL: https://ieeexplore.ieee.org/author/37085828436
    ID: 37085828436
    Order: 12
    Author Affiliations:
    • Sony Semiconductor Manufacturing, Kumamoto, Japan
  • Author Name: Takayuki Toyama
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38032913900
    ID: 38032913900
    Order: 13
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Hayato Iwamoto
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/37297571400
    ID: 37297571400
    Order: 14
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan
  • Author Name: Takayuki Ezaki
    Affiliation: Sony Semiconductor Solutions, Atsugi, Japan
    Author URL: https://ieeexplore.ieee.org/author/38235907400
    ID: 38235907400
    Order: 15
    Author Affiliations:
    • Sony Semiconductor Solutions, Atsugi, Japan

Image Sensor

• sensor_type: CMOS
• resolution: 3840 x 2160
• dynamic_range: 76.3 dB
• pixel_size: 5.86 µm
• dark_current: Not specified in the text.

Optical Data

• focal_length: Not specified in the text.
• aperture: Not specified in the text.
• field_of_view: Not specified in the text.
• distortion: Not specified in the text.

Performance Metrics

• frame_rate: 480 fps
• signal_to_noise_ratio: Not specified in the text.
• sensitivity: 17,500 e-/lx·s
• shutter_speed: Not specified in the text.
• power_consumption: 5.23 W
• noise: 140 µV rms

Applications & Benefits

• cell_imaging: Not specified in the text.
• benefits: Enables highly realistic video systems for 4K digital imaging with capabilities for slow-motion capture.

Supporting Organizations

• supported_by: Sony Corporation

Manuscript Details

• publication_date: April 2017

Relevancy Score

• score: 10

Processed JSON Filename

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