3D Raman Imaging Using Timeresolving Cmos Spad Line Sensor And 2D Mapping
- doi: 10.1109/TIM.2023.3284953
-
title: 3-D Raman Imaging Using Time-Resolving CMOS SPAD
Line Sensor and 2-D Mapping
- publisher: IEEE
- isbn:
- issn: 1557-9662
- rank: 57
-
access_type: CCBY - IEEE is not the copyright holder of
this material. Please follow the instructions via
https://creativecommons.org/licenses/by/4.0/ to obtain full-text
articles and stipulations in the API documentation.
- content_type: Journals
-
abstract: The capability of Raman imaging to produce
2-D and 3-D chemical presentations of samples has gained a lot of
interest in different application fields. In this article, we present a
3-D chemical image reconstruction based on 2-D scanning of a sample
utilizing a time-resolved Raman spectrometer based on a complementary
metal–oxide–semiconductor (CMOS) single-photon avalanche diode (SPAD)
line sensor. The 2-D scanning data contain the lateral information (XY
plane), whereas the time-of-arrival data of the Raman photons measured
by the sensor carry the axial information (i.e., depth information, $Z$
-axis). The sensor is fabricated in 110-nm CMOS technology. It has
256-spectral channels, and each channel has its own 7-bit ON-chip
time-to-digital converter (TDC) with an adjustable resolution from 25 to
65 ps. In addition to the 3-D chemical reconstruction of the scanned
sample, we have shown the ability to retrieve depth profiling
information of each scanned pixel, such as the boundaries and middle
points of any selected layer over the depth range of the scanned object
by means of a single measurement for each scanned pixel. In addition, we
have discussed the system components and the postprocessing parameters
that affect the depth profiling accuracy and the 3-D reconstruction
operation the most. Results showed that the instrument response function
(IRF) of the system and the time gate window width in a postprocessing
phase are playing the most important role in determining the axial
(depth) accuracy. We believe that our system will enable a whole new
class of Raman applications that will allow simultaneous 3-D chemical
geometric representation at the centimeter level during Raman
operations.
- article_number: 10153618
-
pdf_url:
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10153618
-
html_url:
https://ieeexplore.ieee.org/document/10153618/
-
abstract_url:
https://ieeexplore.ieee.org/document/10153618/
-
publication_title: IEEE Transactions on Instrumentation
and Measurement
- conference_location:
- conference_dates:
- publication_number: 19
- is_number: 10012124
- publication_year: 2023
- publication_date: 2023
- start_page: 1
- end_page: 10
- citing_paper_count: 5
- citing_patent_count: 0
- download_count: 796
- insert_date: 20230615
-
index_terms:
-
ieee_terms:
- Single-photon avalanche diodes
- Photonics
- Three-dimensional displays
- Measurement by laser beam
- Chemicals
- Image reconstruction
- Detectors
-
author_terms:
- 3-D Raman imaging
-
complementary metal–oxide–semiconductor (CMOS) single-photon
avalanche diode (SPAD)
- depth analysis
- depth-resolving Raman spectrometer
- time-correlated single photon counting (TCSPC)
-
dynamic_index_terms:
- Raman Imaging
- Single-photon Avalanche Diode
- Raman Spectroscopy
- Raman Spectra
- 3D Reconstruction
- Scan Data
- Depth Range
- Range Of Depths
- Depth Information
- Depth Profile
- Middle Point
- Scan Sampling
- Scans For Each Sample
- Chemical Imaging
- Instrument Response Function
- Time-to-digital Converter
- Axial Depth
- Solid Line
- Horizontal Line
- Function Of Time
- Refractive Index
- Refractive Indices
- Polymethyl Methacrylate Layer
- Layer Of Poly Methyl Methacrylate
- Time Bins
- Short Laser Pulses
- Laser Pulse
- Raman Response
- Μm Area
- Mm In Area
- Raman Intensity
- Gaussian Shape
- Single Piece
- Window Size
-
authors:
-
Author Name: Belal Mostafa Amin
Affiliation: Circuits and Systems Research Unit,
University of Oulu, Oulu, Finland
Author URL:
https://ieeexplore.ieee.org/author/37088757583
ID: 37088757583
Order: 1
Author Affiliations:
-
Circuits and Systems Research Unit, University of Oulu, Oulu,
Finland
-
Author Name: Jere Kekkonen
Affiliation: Circuits and Systems Research Unit,
University of Oulu, Oulu, Finland
Author URL:
https://ieeexplore.ieee.org/author/37086913588
ID: 37086913588
Order: 2
Author Affiliations:
-
Circuits and Systems Research Unit, University of Oulu, Oulu,
Finland
-
Author Name: Tuomo Talala
Affiliation: Circuits and Systems Research Unit,
University of Oulu, Oulu, Finland
Author URL:
https://ieeexplore.ieee.org/author/37086549181
ID: 37086549181
Order: 3
Author Affiliations:
-
Circuits and Systems Research Unit, University of Oulu, Oulu,
Finland
-
Author Name: Ilkka Nissinen
Affiliation: Circuits and Systems Research Unit,
University of Oulu, Oulu, Finland
Author URL:
https://ieeexplore.ieee.org/author/37269813400
ID: 37269813400
Order: 4
Author Affiliations:
-
Circuits and Systems Research Unit, University of Oulu, Oulu,
Finland
Image Sensor
-
sensor_type: CMOS SPAD (Single-Photon Avalanche Diode)
line sensor
- resolution: 256-spectral channels
- dynamic_range: 7-bit
- pixel_size: 27.7 × 27.2 µm
- dark_current: Not specified in the paper.
Optical Data
- focal_length: Not specified in the paper.
- aperture: Not specified in the paper.
- field_of_view: Not specified in the paper.
- distortion: Not specified in the paper.
Performance Metrics
- frame_rate: 280 kHz pulse rate
-
signal_to_noise_ratio: Not specified in the paper.
- sensitivity: Not specified in the paper.
- shutter_speed: Not specified in the paper.
-
power_consumption: 150 mW (average power of the laser)
- noise: Not specified in the paper.
Applications & Benefits
-
cell_imaging: Used in noninvasive chemical composition
analysis through Raman imaging applications.
-
benefits: Enabled simultaneous 3-D chemical geometric
representation.
Supporting Organizations
-
supported_by: Academy of Finland under Contract 323719.
Manuscript Details
Relevancy Score
- score: 9
-
missing_fields:
- fill_factor
- quantum_efficiency
- readout_speed
- noise_sources
- analog_to_digital_conversion_techniques
- microlenses
- on_chip_colour_filters
- global_or_rolling_shutters
- backside_illumination
Processed JSON Filename
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